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Gan film grown on strontium aluminate tantalum lanthanum substrate and its preparation method and application

A technology of strontium tantalum lanthanum aluminate and substrate, applied in the field of GaN thin film and its preparation, can solve the problems of reducing material carrier mobility, film and substrate cracking, affecting device performance, etc., and achieves carrier radiation. High compounding efficiency, repeatability, unique effect of growth process

Active Publication Date: 2015-09-16
SOUTH CHINA UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the luminous efficiency of LED has surpassed that of fluorescent lamps and incandescent lamps, the luminous efficiency of commercial LEDs is still lower than that of sodium lamps (150lm / W), and the price per lumen / watt is relatively high.
At present, the luminous efficiency of LED chips is not high enough, one of the main reasons is that the sapphire substrate causes
Since the lattice mismatch between sapphire and GaN is as high as 17%, a high dislocation density is formed during the epitaxial GaN film process, which reduces the carrier mobility of the material and shortens the carrier lifetime, which in turn affects the GaN substrate. Device performance
Secondly, due to the thermal expansion coefficient of sapphire at room temperature (6.63×10 -6 K -1 ) compared with the thermal expansion coefficient of GaN (5.6×10 -6 K -1 ) is large, and the thermal mismatch between the two is about -18.4%. When the epitaxial layer growth is completed, the device will generate a large compressive stress during the process of cooling the device from the high temperature of the epitaxial growth to room temperature, which will easily lead to the torsion of the film and the substrate. crack
Third, due to the low thermal conductivity of sapphire (25 W / m.K at 100°C), it is difficult to discharge the heat generated in the chip in time, resulting in heat accumulation, which reduces the internal quantum efficiency of the device and ultimately affects the performance of the device

Method used

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  • Gan film grown on strontium aluminate tantalum lanthanum substrate and its preparation method and application
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  • Gan film grown on strontium aluminate tantalum lanthanum substrate and its preparation method and application

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Embodiment 1

[0037] A method for preparing a GaN thin film grown on a strontium aluminate tantalum lanthanum substrate, comprising the following steps:

[0038] (1) Selection of the substrate and its crystal orientation: La 0.3 Sr 1.7 AlTaO 6 The substrate, with the (111) plane offset from the (100) direction by 0.5° as the epitaxial plane, the crystal epitaxial orientation relationship is: the (0001) plane of GaN is parallel to the La 0.3 Sr 1.7 AlTaO 6 The (111) surface.

[0039] (2) Surface polishing, cleaning and annealing of the substrate. The specific process of the annealing is: put the substrate into the annealing chamber, and treat La 0.3 Sr 1.7 AlTaO 6 The substrate was annealed for 3 hours and then air-cooled to room temperature;

[0040] The surface polishing of the substrate is specifically:

[0041] La 0.3 Sr 1.7 AlTaO 6 The surface of the substrate is polished with diamond slurry, and the surface of the substrate is observed with an optical microscope until there...

Embodiment 2

[0055] A method for preparing a GaN thin film grown on a strontium aluminate tantalum lanthanum substrate, comprising the following steps:

[0056] (1) Selection of the substrate and its crystal orientation: La 0.3 Sr 1.7 AlTaO 6 The substrate, with the (111) plane offset from the (100) direction by 1° as the epitaxial plane, the crystal epitaxial orientation relationship is: the (0001) plane of GaN is parallel to the La 0.3 Sr 1.7 AlTaO 6 The (111) surface.

[0057] (2) Substrate surface polishing, cleaning and annealing treatment. The specific process of the annealing is: put the substrate into the annealing chamber, and treat La 0.3 Sr 1.7 AlTaO 6 The substrate was annealed for 5 hours and then air-cooled to room temperature;

[0058] The surface polishing of the substrate is specifically:

[0059] La 0.3 Sr 1.7 AlTaO 6 The surface of the substrate is polished with diamond slurry, and the surface of the substrate is observed with an optical microscope until ther...

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Abstract

The invention discloses a GaN film growing on a La0.3Sr1.7AlTaO6 substrate. The GaN film comprises a GaN buffer layer growing on the La0.3Sr1.7AlTaO6 substrate and the GaN film growing on the GaN buffer layer. The La0.3Sr1.7AlTaO6 substrate takes a surface (111) leaning in a direction (100) of 0.5-1 degrees as an epitaxial surface. The invention further discloses a manufacturing method of the GaN film. Compared with the prior art, the GaN film growing on the La0.3Sr1.7AlTaO6 substrate and the manufacturing method have the advantages that the GaN film is simple in growing process, and manufacturing cost is low. Meanwhile, the GaN film has the advantages of low defect density and good crystallization quality and the like.

Description

technical field [0001] The present invention relates to GaN films, in particular to GaN films grown on strontium aluminate tantalum lanthanum (La 0.3 Sr 1.7 AlTaO 6 ) GaN film on substrate and its preparation method and application. Background technique [0002] Light-emitting diode (LED), as a new type of solid-state lighting source and green light source, has outstanding features such as small size, low power consumption, environmental protection, long service life, high brightness, low heat and colorful, and is widely used in outdoor lighting, commercial lighting and decoration Engineering and other fields have a wide range of applications. At present, under the background of the increasingly serious problem of global warming, saving energy and reducing greenhouse gas emissions has become an important issue faced by the whole world. A low-carbon economy based on low energy consumption, low pollution, and low emissions will become an important direction of economic dev...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/20H01L21/203H01L33/00H01L31/18
CPCY02P70/50
Inventor 李国强王文樑杨为家刘作莲林云昊
Owner SOUTH CHINA UNIV OF TECH
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