Antireflective film for solar cell piece and manufacturing method thereof

A solar cell sheet and manufacturing method technology, applied in the field of solar energy utilization, can solve problems such as poor anti-reflection effect, achieve the effects of improving short-circuit current, uniform appearance and color, and improving photoelectric conversion efficiency

Inactive Publication Date: 2014-10-08
INNER MONGOLIA RIYUE SOLAR ENERGY TECH +1
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the double-layer silicon nitride film has significantly improved the problems caused by only a single-layer silicon nitride film, enhanced the anti-reflection effect on light, and improved the short-circuit current of the battery, but the biggest problem with the double-layer silicon nitride film is The anti-reflection effect in the short-wave direction is poor, so the deposition process must be continuously improved and optimized

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Antireflective film for solar cell piece and manufacturing method thereof
  • Antireflective film for solar cell piece and manufacturing method thereof
  • Antireflective film for solar cell piece and manufacturing method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0066] Using a domestic plasma enhanced chemical vapor deposition instrument (model: M82200-3 / UM), deposit the first layer of silicon nitride film on the surface of a clean and dry metallurgical polysilicon wafer at a temperature of 460°C, a pressure of 193Pa, and an ammonia gas flow rate of 3000sccm , the silane flow rate is 1000sccm, the deposition power is 4000W, and the duration is 100s to obtain the first silicon nitride film with a thickness of 24-26nm and a refractive index of 2.5-2.6;

[0067] Continuously deposit the second layer of silicon nitride film on the first layer of silicon nitride film, the temperature is 460°C, the pressure is 187Pa, the flow rate of ammonia gas is 3429sccm, the flow rate of silane is 571sccm, the deposition power is 4000W, and the duration is 70-90s to obtain a second layer of silicon nitride thin film with a thickness of 15-20 nm and a refractive index of 2.3-2.4;

[0068] Continuously deposit the third layer of silicon nitride film on th...

Embodiment 2

[0072] Using a domestic plasma enhanced chemical vapor deposition instrument (model: M82200-3 / UM), deposit the first layer of silicon nitride film on the surface of a clean and dry metallurgical polysilicon wafer at a temperature of 460°C, a pressure of 195Pa, and an ammonia flow rate of 3010sccm , the silane flow rate is 1003sccm, the deposition power is 2500W, and the duration is 100s to obtain the first layer of silicon nitride film with a thickness of 30nm and a refractive index of 2.7;

[0073] Adjust the deposition power to 0, maintain the pressure at 180-190Pa, stop feeding the reaction gas, and maintain this state for 5-10 seconds, and then start to deposit the second layer of silicon nitride film on the first layer of silicon nitride film , the temperature is 460°C, the pressure is 186Pa, the flow rate of ammonia gas is 3439 sccm, the flow rate of silane gas is 573 sccm, the deposition power is 2500W, and the duration is 90s to obtain a second layer of silicon nitride ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
thicknessaaaaaaaaaa
Login to view more

Abstract

The invention provides an antireflective film for a solar cell piece and a manufacturing method of the antireflective film. The antireflective film for the solar cell piece comprises a first silicon nitride layer covering the surface of the solar cell piece, a second silicon nitride layer covering the upper surface of the first silicon nitride layer and a third silicon nitride layer covering the upper surface of the second silicon nitride layer. By means of the antireflective film for the solar cell piece, the three layers of silicon nitride antireflective films are adopted, the good passivating effect can be achieved, the short-circuit current of the metallurgical polycrystalline silicon cell pieces can be improved, the reverse leakage current can be reduced, and photovoltaic conversion efficiency is improved. Meanwhile, according to the manufacturing method of the antireflective film, an intermittent deposition technology is adopted, that is, a certain dead time is added between depositions of the two layers of silicon nitride thin films, so that the growth of all layers of silicon nitride thin films is complete as much as possible, the manufactured metallurgical polycrystalline silicon cells are more even in color of appearance, the chromatic aberration rate of the surfaces of the cell pieces is reduced by about 5% from the original 30%, and the yield of the metallurgical polycrystalline silicon cells is improved greatly.

Description

technical field [0001] The invention relates to the technical field of solar energy utilization, in particular to an anti-reflection film used for solar cells and a manufacturing method thereof. Background technique [0002] Over the years, crystalline silicon solar cells have occupied about 90% of the photovoltaic market due to their high cost performance. The conventional chemical method (improved Siemens method) to purify solar-grade silicon materials has a mature production process and high purity, but there are problems such as high cost, heavy pollution and low production capacity, which prompts people to look for new low-cost and high-production purification technologies. In recent years, physical metallurgical polysilicon purification technology has been re-emphasized and developed rapidly. At present, the purity of polysilicon purified by this technology has basically reached the 6N level required by the photovoltaic level. Although domestic polysilicon purificati...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/0216H01L31/18C23C16/34
CPCC23C16/345H01L31/02168H01L31/1868Y02E10/50Y02P70/50
Inventor 郭永强和江变于利亚马承鸿宗灵仑李健
Owner INNER MONGOLIA RIYUE SOLAR ENERGY TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products