(111) Three-axis micromachined acceleration sensor integrated on a single silicon chip and its manufacturing method
An acceleration sensor and acceleration sensing technology, which are used in multi-dimensional acceleration measurement, acceleration measurement using inertial force, and microstructure devices composed of deformable elements, which can solve the problems of complex manufacturing process, difficult to meet detection, large size, etc. problems, to achieve good process compatibility, reduce production costs, and simplify the production process.
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Embodiment 1
[0047] see figure 1 , the present invention provides a (111) three-axis micromachined acceleration sensor integrated with a single silicon chip, the (111) three-axis micromachined acceleration sensor integrated with a single silicon chip at least includes: (111) a single silicon chip and all integrated in Three mutually independent acceleration sensing units 1 in the X-axis direction, 2 acceleration sensing units 2 in the Y-axis direction and 3 acceleration sensing units 3 in the Z-axis direction on the (111) single silicon chip; The acceleration sensing unit 1, the acceleration sensing unit 2 in the Y-axis direction, and the acceleration sensing unit 3 in the Z-axis direction are integrated on the same surface of the (111) single silicon chip; wherein, the acceleration in the X-axis direction The sensing unit 1 has the same structure as the acceleration sensing unit 2 in the Y-axis direction, and both include a first cantilever beam 4 and a first pressure-sensitive resistor 5...
Embodiment 2
[0060] see Figure 3 to Figure 4 , the present invention also provides a (111) manufacturing method of a three-axis micromachined acceleration sensor integrated on a single silicon chip, comprising the following steps:
[0061] 1) An n-type (111) single silicon wafer is provided, the single-sided polished or double-sided polished silicon wafer, and the axis offcut is 0±0.1°; the method of boron ion implantation is used on the (111) single silicon wafer Make pressure-sensitive resistors and reference resistors on the front side, and the resistance value of the resistors is 2.0kΩ~3.0kΩ (such as Figure 4 (a) shown).
[0062] 2) Depositing low-stress silicon nitride and TEOS silicon oxide sequentially on the front side of the (111) single silicon wafer as a surface passivation protection layer by using LPCVD process.
[0063] 3) Using a two-step silicon deep reactive ion etching process to make a plurality of release windows at intervals on the (111) single silicon wafer, the r...
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