Diamond wire cutting-based silicon wafer texturing pretreatment method and silicon wafer texturing method
A diamond wire cutting and pretreatment technology, applied in post-processing, post-processing details, chemical instruments and methods, etc., can solve the problems that the reflectivity of silicon wafers cannot meet the requirements of industrial production, it is difficult to eliminate, and the application and promotion of diamond cutting technology is limited. , to achieve the effect of low cost, reduced surface reflectivity, and no trace
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Embodiment 1
[0061] Mix 40wt% hydrofluoric acid solution, 30wt% hydrogen peroxide solution and water at a volume ratio of 3:24:5, and add silver nitrate to obtain a pretreatment solution. The silver nitrate concentration in the pretreatment liquid is 80 μmol / L.
[0062] Use 10wt% hydrofluoric acid solution to remove oil stains and oxide layers on the silicon wafer surface cut by diamond wire, then place the silicon wafer in the pretreatment solution to carry out pretreatment A process, the pretreatment temperature is 25 ° C, and the pretreatment time is 5 minutes. Then rinse with deionized water for 2 minutes, soak in nitric acid for 2 minutes to remove silver particles on the surface, and rinse with deionized water for 2 minutes.
[0063] Repeat the pretreatment B process by putting the above silicon wafers into the pretreatment solution, the pretreatment temperature is 25° C., and the pretreatment time is 1 minute. Then rinse with deionized water for 2 minutes.
[0064] Mix 40wt% hydr...
Embodiment 2
[0066] The velvet pretreatment method and the velvet method of embodiment 2 are basically the same as the velvet pretreatment method and the velvet method of embodiment 1, the difference is that the pretreatment liquid is composed of 40wt% hydrofluoric acid solution and 30wt% hydrogen peroxide The solution was mixed at a volume ratio of 5:18, the concentration of silver nitrate in the pretreatment solution was 3 μmol / L, the pretreatment A process time was 10 minutes, and the pretreatment B process reaction time was 3 minutes. Figure 4 It is the SEM image of the surface after silicon wafer pretreatment, Figure 5 SEM image of the surface of the silicon wafer after texturing.
Embodiment 3
[0068] The texturing pretreatment method and texturing method of embodiment 3 are basically the same as the texturing pretreatment method and texturing method of embodiment 1, the difference lies in the pretreatment liquid concentration and pretreatment B process time, 50wt% hydrofluoric acid Solution, 30wt% hydrogen peroxide solution and 89% isopropanol are mixed with a volume ratio of 1:20:3, the metal salt in the pretreatment solution is copper nitrate, and the concentration of the copper nitrate solution is 1000 μmol / L, pretreatment A The process time is 9 minutes, and the pretreatment temperature is 40°C; the reaction time of the pretreatment B process is 40 seconds, and the treatment temperature is 30°C. Pretreatment A process reaction time and temperature are identical with embodiment 1. Figure 6 It is the SEM image of the surface after silicon wafer pretreatment, Figure 7 SEM image of the surface of the silicon wafer after texturing.
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