Method for preparing scintillation crystal detection unit

A technology of crystal units and scintillation crystals, applied in the field of radiation detection, to achieve the effects of improving transmission efficiency, reducing losses, avoiding absorption and reducing reflectivity

Active Publication Date: 2016-07-27
HUAZHONG UNIV OF SCI & TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides a method for preparing a scintillation crystal detection unit, which solves the contradiction between the batch processing of existing scintillation crystals and the high processing quality of obtaining nanometer-level surface roughness and hundreds of micron-level surface flatness

Method used

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  • Method for preparing scintillation crystal detection unit
  • Method for preparing scintillation crystal detection unit
  • Method for preparing scintillation crystal detection unit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0044] Example 1, such as figure 1 As shown, it includes crystal cutting and forming steps, crystal unit surface processing steps, crystal unit surface film coating steps and reflective material coating steps:

[0045] (1) Crystal cutting and molding step, cutting the scintillation crystal into crystal units with the same shape and size, the crystal unit is a strip crystal, the strip crystal is a quadrangular prism, and its cross section is a square, and the scintillation The crystal material is yttrium lutetium silicate;

[0046] (2) The surface processing step of the crystal unit, including the following sub-steps:

[0047] (2.1) Backplane heating:

[0048] Use a constant temperature control heating device to heat the back plate, and the temperature is controlled at 80°C; spin-coat wax on the surface of the back plate;

[0049] The back plate is a plate made of fused silica glass, the shape is circular, the upper and lower sides of the back plate are parallel planes, and ...

Embodiment 2

[0065] Embodiment 2, including the crystal cutting and forming step, the crystal unit surface processing step, the crystal unit surface film coating step and the reflective material coating step:

[0066] (1) Crystal cutting and molding step, cutting the scintillation crystal into crystal units with the same shape and size, the crystal unit is a strip crystal, the strip crystal is a quadrangular prism, and its cross section is a square, and the scintillation The crystal is lutetium silicate;

[0067] (2) The surface processing step of the crystal unit, including the following sub-steps:

[0068] (2.1) Backplane heating:

[0069] Use a constant temperature control heating device to heat the back plate, and the temperature is controlled at 120°C; spin-coat epoxy resin on the surface of the back plate, the back plate is made of fused silica glass, the shape is circular, and the upper and lower sides of the back plate are parallel surfaces. The flatness of the upper and lower su...

Embodiment 3

[0085] Embodiment 3, including the crystal cutting and forming step, the crystal unit surface processing step, the crystal unit surface film coating step and the reflective material coating step:

[0086] (1) Crystal cutting and molding step, cutting the scintillation crystal into crystal units with the same shape and size, the crystal unit is a strip crystal, the strip crystal is a quadrangular prism, and its cross section is a square, and the scintillation The crystal is gadolinium lutetium silicate;

[0087] (2) The surface processing step of the crystal unit, including the following sub-steps:

[0088] (2.1) Backplane heating:

[0089] Use a constant temperature control heating device to heat the back plate, and the temperature is controlled at 120°C; spin-coat epoxy resin on the surface of the back plate, the back plate is made of fused silica glass, the shape is circular, and the upper and lower sides of the back plate are parallel surfaces. The flatness of the upper a...

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Abstract

The invention relates to a method for preparing scintillation crystal detection unit, belongs to the technology field of radiation detection, and resolves a conflict between batch processing of crystal in the prior art and high surface quality. The method comprises the steps including a crystal cutting and forming step, a crystal unit surface processing step, a crystal unit surface thin-film coating step and a reflecting material cladding step. The designing and coating of scintillation crystal detection unit surface high reflective film provided by the invention can completely cover an emission spectrum of the scintillation crystal, reflectivity of specific band of the scintillation crystal can be pointedly improved, a problem of reducing absorption and reflectivity of photon in reflective film gaps probably caused by adopting the reflective film pasted on the crystal surface can be avoided, transmission efficiency of photon is improved, and the loss during the photon transmission process is reduced. The method does not ask for high rank and precise processing equipment and is good for industrial mass production.

Description

technical field [0001] The invention belongs to the technical field of radiation detection, and in particular relates to a preparation method of a scintillation crystal detection unit, which includes precision grinding and polishing of the surface of the scintillation crystal and preparation of an internal reflection high-reflection film covering the emission spectrum of the crystal on the crystal surface. Background technique [0002] Scintillation crystal is an inorganic crystal material that can detect high-energy rays. High-energy particles are incident into the scintillation crystal, and the scintillation crystal generates electron energy level transitions under the excitation of high-energy photons, and then high-energy electrons transition to low energy levels, releasing Visible photons with wavelengths in the near-ultraviolet-visible wavelength range cooperate with the photoelectric detection element at the back end to detect visible photons emitted by scintillation c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/202B28D5/00B24B1/00
CPCB24B1/00B28D5/00G01T1/202
Inventor 许剑锋郭凌曦孙权权唐宏亮吴忠鼎兰洁陈肖
Owner HUAZHONG UNIV OF SCI & TECH
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