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Manufacturing method of composite piezoelectric substrate for surface acoustic wave device

A technology of surface acoustic wave devices and manufacturing methods, applied in semiconductor/solid-state device manufacturing, piezoelectric devices/electrostrictive devices, device components, etc., can solve the problems of increased production process risks and costs, fragmentation, and low cooling efficiency To achieve the effect of reducing process risk and process cost, improving material utilization rate and shortening production cycle

Active Publication Date: 2018-08-03
JINAN JINGZHENG ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the stress is too large, it will cause cracking of lithium tantalate and silicon substrate
[0006] The lithium tantalate layer in the bonding body needs to be thinned before separation, and the removal of lithium tantalate is relatively large, and the separated lithium tantalate cannot be reused, resulting in serious waste of materials
[0007] Due to the large thermal expansion coefficient of the lithium tantalate wafer during ion implantation, when the backside cooling is applied, a large stress will be generated due to the huge temperature difference between the two surfaces of the lithium tantalate wafer, resulting in cracking. crack; if not cooled, its injection efficiency is limited by the injection temperature
And the thermal conductivity of lithium tantalate wafers is low, resulting in low efficiency of backside cooling
[0008] The production process is complicated, which increases the risk and cost of the production process

Method used

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  • Manufacturing method of composite piezoelectric substrate for surface acoustic wave device
  • Manufacturing method of composite piezoelectric substrate for surface acoustic wave device
  • Manufacturing method of composite piezoelectric substrate for surface acoustic wave device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0059] (1) Provide a 3-inch Z-cut lithium tantalate wafer, provide a 3-inch monocrystalline silicon wafer, place the lithium tantalate wafer and silicon wafer on the porous ceramic suction cup of the polishing machine, and adjust the inclination of the spindle , to polish the surface to obtain a smooth surface. The polished wafer is cleaned at the semiconductor level to obtain a wafer with a clean surface.

[0060] (2) The wafer with a clean surface obtained in step (1) is directly contacted at room temperature, and the lithium tantalate wafer and the silicon wafer are bonded together due to the van der Waals force.

[0061] (3) Thinning the lithium tantalate wafer in the above bonding body to 20um, and then performing chemical mechanical polishing to obtain a smooth surface.

[0062] (4) Perform He on the lithium tantalate wafer surface of the bonding body + Ion implantation determines the depth of the implanted layer by controlling the implantation energy. The injected do...

Embodiment 2

[0066] (1) Provide a 3-inch Z-cut lithium niobate wafer and a 3-inch silicon wafer, respectively place one wafer surface of the lithium niobate and silicon wafer on the porous ceramic suction cup of the polishing machine, and adjust the inclination of the spindle , to polish the surface to obtain a smooth surface. The polished wafer is subjected to semiconductor-grade cleaning to obtain a wafer with a clean surface.

[0067] (2) The wafer with a clean surface obtained in step (1) is directly contacted at room temperature, and the lithium niobate wafer and the silicon wafer are bonded together due to the van der Waals force.

[0068] (3) Thinning the lithium niobate wafer in the above bonding body to 30um, and then performing chemical mechanical polishing to obtain a smooth surface.

[0069] (4) The lithium niobate wafer surface of the bonding body is implanted with He by ion implantation + , by controlling the implant energy to determine the depth of the implanted layer. Th...

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PUM

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Abstract

The invention provides a method for manufacturing a composite piezoelectric substrate for a surface acoustic wave device. The method comprises the following steps of providing a silicon wafer and a piezoelectric wafer which are provided with polishing surfaces, and performing semiconductor-level cleaning on the silicon wafer and the piezoelectric wafer; forming a first bonding body; sequentially thinning and polishing the piezoelectric wafer of the first bonding body; performing ion injection onto the piezoelectric wafer in the first bonding body after thinning and polishing; forming a secondbonding body; heating the second bonding body to achieve thermal separation of the piezoelectric wafer so as to obtain the composite piezoelectric substrate and a third bonding body; and annealing thecomposite piezoelectric substrate. The third bonding body is obtained after recycling and thermal separation, so that the raw material utilization ratio is improved.

Description

technical field [0001] The invention relates to a manufacturing method of a composite piezoelectric substrate for a surface acoustic wave device. Background technique [0002] The high-speed growth of mobile data volume puts forward higher requirements for data transmission. For the fifth generation mobile communication system, in the long-term evolution of the LTE system, the frequency difference of the frequency division duplex communication technology is getting smaller and smaller. In this case, it is necessary to equip filters with characteristics such as excellent frequency band selectivity, high Q value, and low insertion loss. At the same time, in the 5G communication era, the increase in high-frequency communication and the number of frequency bands will greatly increase the demand for filters. [0003] Lithium tantalate wafer is a commonly used piezoelectric substrate for making filters, which is usually prepared directly from lithium tantalate die. However, the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L41/02H01L41/08H01L21/18H10N30/00
CPCH01L21/187H10N30/80H10N30/706Y02P70/50
Inventor 李真宇朱厚彬张秀全胡卉
Owner JINAN JINGZHENG ELECTRONICS
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