Time-to-analog conversion circuit applied to single photon detector

A single-photon detector, analog conversion technology, applied in instruments and other directions, can solve the problems of small analog output range, short measurement time range, low time resolution, etc., and achieve CMOS process compatibility, large readout range, and performance consistency. Good results

Active Publication Date: 2018-12-07
NANJING UNIV OF POSTS & TELECOMM +1
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  • Abstract
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AI Technical Summary

Problems solved by technology

However, the measurement time range of traditional TAC circuits is shorter, usually ranging from a few nanoseconds to tens of nanoseconds, so t

Method used

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  • Time-to-analog conversion circuit applied to single photon detector
  • Time-to-analog conversion circuit applied to single photon detector
  • Time-to-analog conversion circuit applied to single photon detector

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with the accompanying drawings.

[0035] figure 1 Shown is the topological diagram of the time-analog conversion circuit applied to the single photon detector of the present invention, including: quenching circuit, RS flip-flop F, transmission gate TG, single-pole double-throw switch S, sampling capacitor C and source The follower circuit; the transmission gate G, the sampling capacitor C and the source follower circuit constitute a tracking and holding circuit, which realizes sampling of an external triangular wave signal.

[0036] The quenching circuit includes single photon avalanche diode SPAD and MOS tubes MN1 and MN2, the cathode of SPAD is connected to the set potential, the anode is connected to the drain of MN1; the source of MN1 is grounded, and the gate is connected to the external reset signal V q ; The source of MN2 is connected to the anode of the single photon avalanche diode SPAD, the ...

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Abstract

The invention provides a time-to-analog conversion circuit applied to a single photon detector. The time-to-analog conversion circuit comprises a quenching circuit, an RS trigger F, a transmission gate TG, a single-pole double-throw switch S, a sampling capacitor C and a source follower circuit; and quenching reset controls a quenching reset of an SPAD and controls transmission of an avalanche signal, the RS trigger is controlled via the avalanche signal to sample a triangular wave synchronized with an exposure signal by a tracking and holding circuit, so that a voltage value linearly relatedto the photon flight time is obtained, and the RS trigger plays a role in resetting for a sample tracking circuit. The single-pole double-throw switch provides different reference signals to the tracking and holding circuit during reset and photon flight time measurement phases. The time-to-analog conversion circuit comprises the trigger, has the advantages of simple circuit structure, the less control time sequence signals and the small occupied area, and is suitable for a large-scale pixel array; and a high filling factor can be reached. The time-to-analog conversion circuit has a high output range, so the time-to-analog conversion circuit has small time resolution and is suitable for the relatively precise measurement for photon flight time.

Description

technical field [0001] The invention relates to the field of optoelectronic technology, in particular to a time-to-analog conversion circuit applied to a single photon detector. Background technique [0002] Single-photon avalanche diode (SPAD) has significant advantages such as large avalanche gain, fast response speed, high detection efficiency, low cost, and low power consumption. 3D imaging and other aspects have broad application prospects. In applications such as SPAD-based fluorescence lifetime imaging, time-correlated single-photon counting (TCSPC) techniques are used to determine the time-of-flight of photons and thus the distance to objects. Currently, a time-to-digital converter (TDC) converts the detected time into a digital signal, and then extracts the position information to restore a 3D image. The detection time of TDC is affected by the time resolution. If the detection distance is long, the measured flight time will also be long, which requires a geometri...

Claims

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Application Information

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IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 李鼎徐跃吴仲
Owner NANJING UNIV OF POSTS & TELECOMM
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