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Post-positioned light splitting pupil laser confocal mass spectrum microscopic imaging method and device

A micro-imaging and split-pupil technology, which is applied in the directions of measurement devices, analytical materials, and material excitation analysis, can solve the problems of large laser focus spot, low spatial resolution of mass spectrometry detection, and long mass spectrometry imaging time, etc., to achieve extended application field, achieving versatility, and improving the effect of spatial resolution

Inactive Publication Date: 2019-01-11
BEIJING INSTITUTE OF TECHNOLOGYGY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 1) Due to the use of simple laser focusing to desorb and ionize the sample, there are still problems such as large laser focusing spot and low spatial resolution of mass spectrometry detection;
[0006] 2) The time required for mass spectrometry imaging is long, and the axial position of the focused spot of the laser mass spectrometer often drifts relative to the sample to be measured

Method used

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  • Post-positioned light splitting pupil laser confocal mass spectrum microscopic imaging method and device
  • Post-positioned light splitting pupil laser confocal mass spectrum microscopic imaging method and device
  • Post-positioned light splitting pupil laser confocal mass spectrum microscopic imaging method and device

Examples

Experimental program
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Effect test

Embodiment 1

[0042] Such as figure 1 As shown, a D-type rear collecting pupil 11 is placed on the pupil surface of the detection objective lens 13, a point light source is selected for the light source system 1, and the excitation beam emitted by the point light source passes through the collimating lens 2, the compressed focusing spot system 4, the beam splitting prism 5, After the dichroic mirror A6 and the measuring objective lens 7 converge on the measured sample 8, the computer 30 controls the precision three-dimensional workbench 10 to drive the measured sample 8 to move up and down near the focus of the measuring objective lens 7, and the light reflected by the sample passes through the dichroic The mirror A6 reflection and the dichroic prism 5 reflection pass through the D-type collection pupil in the D-type rear pupil 11, the detection objective lens 13 and the relay magnification lens 14, and are collected by the light intensity detector 17 after passing through the pinhole 16. T...

Embodiment 2

[0050] Such as figure 2 As shown, in the rear split pupil laser confocal mass spectrometer imaging device, the compressed focus spot system 4 is replaced by a vector beam generation system 31 and a pupil filter 32, and the D-type collection pupil in the D-type rear pupil 11 12 can be replaced by a circular collection pupil 34 in a circular rear pupil 33, and the pinhole 16 and light intensity detector 17 in the rear split pupil laser confocal detection module can be replaced by a CCD detector 35, wherein the detection area is located at The center of the image plane of the CCD detector.

[0051] The remaining imaging methods and processes are the same as in Example 1.

Embodiment 3

[0053] Such as image 3 As shown, in the rear split-pupil laser confocal mass spectrometer imaging device, the point light source is replaced by a pulse laser 36, a condenser lens 37, and a light-transmitting optical fiber 38 at the focal point of the condenser lens 37, and the light beam emitted by the laser 36 is condensed The lens 37 converges, is received by the optical fiber incident end 26 that is positioned at the focal point of the focusing lens 37, sends out and forms a point light source by the optical fiber output end 27 after passing through the optical fiber 38 transmission; Simultaneously, introduces the outgoing beam attenuator 39 in the laser focusing system, A detection beam attenuator 40 is introduced into the rear split pupil laser confocal detection system. The light intensity adjustment system is composed of the exit beam attenuator 39 and the detection beam attenuator 40. The exit beam attenuator 43 modulates the illumination beam into an attenuated beam ...

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Abstract

The invention discloses a post-positioned light splitting pupil laser confocal mass spectrum microscopic imaging method and device, and belongs to the technical field of confocal microscopic imaging and mass spectrum imaging measurement. A post-positioned light splitting pupil laser confocal microscopic imaging technology is combined with a mass spectrum detection technology; a tiny focusing facula of a post-positioned light splitting pupil confocal microscope processed by a superresolution technology is used for performing high spatial resolution morphological imaging on a sample; a mass spectrum detection system is used for performing mass spectrum detection on charged molecules and atoms in the microdomain of the sample; laser mass spectrum detection is fused with a post-positioned light splitting pupil confocal detection structure to achieve high spatial resolution and high sensitivity imaging and detection of microdomain complete component information and morphological parameter of the sample. According to the method and device provided by the invention, the brand new effective technical approach can be provided for material component and morphological imaging detection in thefields of biomedicine and material science.

Description

technical field [0001] The invention belongs to the field of confocal microscopic imaging technology imaging technology and mass spectrometry imaging technology, and combines post-splitting pupil laser confocal microscopic imaging technology with mass spectrometry imaging technology, and relates to a post-splitting pupil laser confocal mass spectrometry microscopic imaging method and device. It has broad application prospects in biomedicine, material science, physical chemistry, minerals, micro-nano manufacturing and other fields. Background technique [0002] Mass Spectrometry (Mass Spectrometry) is to ionize the components in the sample, so that the generated charged atoms, molecules or molecular fragments with different charge-to-mass ratios are respectively focused under the action of an electric field and a magnetic field to obtain a sequence of mass-to-charge ratios. Spectrograph instrument. Mass spectrometry imaging is to perform mass spectrometry analysis on multipl...

Claims

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Application Information

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IPC IPC(8): G01N27/64G01N21/63G01N21/01
CPCG01N27/64G01N21/01G01N21/63
Inventor 邱丽荣王允赵维谦
Owner BEIJING INSTITUTE OF TECHNOLOGYGY