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Method for detecting photo ionization microscopic imaging of Rydberg atoms

A technology of microscopic imaging and photoionization, which is applied in the field of photoelectric information, can solve the problems that have not been reported, and achieve the effect of clear physical image, short time and clear interference pattern

Inactive Publication Date: 2019-10-01
LUDONG UNIVERSITY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the previous studies, they mainly focused on the study of Rydberg atom photoionization microscopy in static electric and magnetic fields. There is no report on the research on the interference pattern of Rydberg atom photoionization microscopy in oscillating electric field.

Method used

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  • Method for detecting photo ionization microscopic imaging of Rydberg atoms
  • Method for detecting photo ionization microscopic imaging of Rydberg atoms
  • Method for detecting photo ionization microscopic imaging of Rydberg atoms

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0048] S1. Irradiate hydrogen atoms with a beam of laser light to transition electrons from the ground state to a highly excited state;

[0049] S2. Apply an external oscillating electric field, and write the Hamiltonian of photoionized electrons in the oscillating electric field and the Coulomb field:

[0050]

[0051] The Hamiltonian is scaled as follows:

[0052]

[0053]

[0054] Get the Hamiltonian after scale transformation:

[0055]

[0056] In order to eliminate the singularity of the above equation at the origin, the parabolic coordinate (u, v) and its conjugate momentum are introduced, defined as:

[0057]

[0058] in:

[0059]

[0060] Give a new scaled time variable:

[0061] dτ / dt=1 / (u 2 +v 2 ) (6)

[0062] We get the actual Hamiltonian as:

[0063] h=(u 2 +v 2 )(H-ε) (7)

[0064]

[0065] Assume that ionized electrons exit at an angle θ i Emit from origin:,

[0066] θ i =tan -1 (ρ / z)=2tan -1 (v / u) (9)

[0067] It is the angle ...

Embodiment 2

[0082] Similar to Example 1, the difference is that in step 5, the position of the detection plane and the scale energy of the Rydberg hydrogen atom, z, are fixed. 0 =4.0s.u.≈4.8um, the scale energy of Rydberg hydrogen atom ε=-0.1, changing the frequency of the oscillating electric field, realizes the regulation of photoionization microscopic interference imaging. Assume that the frequency of the oscillating electric field varies between 0.01π and 0.09π. The result is as Figure 4-7 shown. Figure 4 The distribution curves of t-ρ on the detection plane are given in the electric field with different oscillation frequencies.

[0083] from Figure 4 It can be seen that as the frequency of the oscillating electric field increases, the trajectory of the photoionized electrons arriving at a point on the detection plane decreases, and the maximum collision radius of the electrons reaching the detection plane decreases.

[0084] Figure 5 The two-dimensional electron probability ...

Embodiment 3

[0087] Similar to Embodiments 1 and 2, the difference is that in step 5, the position of the detection plane and the frequency of the oscillating electric field are fixed, z 0 =4.0s.u.≈4.8um, ω=0.05π, change the scale energy of Rydberg hydrogen atoms, and realize the regulation of photoionization micro-interference imaging. Assume that the scale energy of the Rydberg hydrogen atom varies between -0.01 and -1.0. The result is as Figure 8-11 shown. Figure 8 The ρ-θ distribution curves of photoionized electrons arriving on the detection plane are given when the Rydberg hydrogen atoms take different scale energies. Figure 9 The two-dimensional probability density distribution curve of Rydberg hydrogen atoms reaching the detection plane in an oscillating electric field is given as a function of the scale energy. Figure 10 and 11 The three-dimensional probability density distribution curve of Rydberg hydrogen atoms reaching the detection plane in the oscillating electric fie...

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Abstract

The invention discloses a method for detecting the photo ionization microscopic imaging of Rydberg atoms. A time-dependent semi-classical theory method is adopted. A relatively clear interference pattern of photo ionization microscopic imaging is obtained by changing the scale energy of Rydberg atoms and the frequency of an oscillating electric field. By changing the position of a detection plane,the oscillating structure of an electron wave function can be directly observed on the macro scale. The disclosed photo ionization microscopic imaging method makes people's observation of a microscopic particle wave function become reality. The photo ionization microscopic interference pattern imaging method is of great significance to the analysis of experimental results in related fields, the interpretation of experimental phenomena and the optimization of instruments and equipment. The method of the invention not only provides some theoretical guidance for the development and experimentalresearch of a photo ionization microscope, but also has an important application prospect in astrophysics, plasma physics, ion trapping, design and development of semiconductor micro junction devicesand other high-tech information technology fields.

Description

technical field [0001] The invention belongs to the technical field of optoelectronic information, and in particular relates to a method for detecting Rydberg atomic photoionization microscopic imaging. Background technique [0002] With the development of laser technology, the interaction between laser and atoms and molecules has become an important means for human beings to explore physical structure properties and physical laws. With the development of Internet big data and high-capacity information, the development of electronics has certain limitations. Since the speed of photons is much faster, the frequency of light is much higher than that of radio. In order to improve the propagation speed and current-carrying density, the development from electrons to photons is an inevitable trend, which will lead to a breakthrough in the development of a new generation of information technology. . At present, the detection, transmission, storage, display, operation and processi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/06H01J49/04H01J49/02
CPCH01J49/027H01J49/04H01J49/061
Inventor 王德华张杰徐钦峰孙兆鹏焦蒙蒙赵刚
Owner LUDONG UNIVERSITY
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