Growth method of LED epitaxial structure
A growth method and epitaxial structure technology, applied in gaseous chemical plating, coating, electrical components and other directions, can solve the problems of low growth quality of quantum wells and low radiation recombination efficiency of quantum wells, so as to improve luminous efficiency and reduce luminescence. Attenuation effect, the effect of improving product yield
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Embodiment 1
[0041] This embodiment adopts the LED epitaxial structure growth method provided by the present invention, adopts MOCVD to grow GaN-based LED epitaxial wafers, and uses high-purity H 2 or high purity N 2 or high purity H 2 and high purity N 2 The mixed gas as the carrier gas, high-purity NH 3 As the N source, the metal-organic source trimethylgallium (TMGa) is used as the gallium source, trimethylindium (TMIn) is used as the indium source, and the N-type dopant is silane (SiH 4 ), trimethylaluminum (TMAl) as the aluminum source, and the P-type dopant as magnesium dicene (CP 2 Mg), the reaction pressure is between 70mbar and 900mbar. The specific growth method is as follows (for the epitaxial structure, please refer to figure 1 ):
[0042] A method for growing an LED epitaxial structure, which sequentially includes: processing a substrate 1, growing a low-temperature buffer layer GaN2, growing an undoped GaN layer 3, growing a Si-doped N-type GaN layer 4, growing a multi-...
Embodiment 2
[0073] Comparative examples are provided below, that is, the growth method of the traditional LED epitaxial structure (for the epitaxial structure, please refer to figure 2 ).
[0074] Step 1: At a temperature of 1000-1100°C and a reaction chamber pressure of 100-300mbar, feed 100-130L / min of H 2 Under the conditions, process the sapphire substrate for 5-10 minutes.
[0075] Step 2: growing a low-temperature GaN buffer layer, and forming irregular small islands in the low-temperature GaN buffer layer 2 .
[0076] Specifically, the step 2 is further as follows:
[0077] At a temperature of 500-600°C and a reaction chamber pressure of 300-600mbar, 10000-20000sccm of NH is introduced 3 , 50-100sccm TMGa, 100-130L / min H 2 Under the condition of , the low-temperature buffer layer GaN2 is grown on the sapphire substrate 1, and the thickness of the low-temperature GaN buffer layer 2 is 20-40nm;
[0078] At a temperature of 1000-1100°C and a reaction chamber pressure of 300-600m...
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