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Displacement sensing device based on Bloch surface wave one-way coupling effect

A technology of coupling effect and sensing device, which is applied in the field of optical sensing, can solve the problems of small measuring range, complex incident light field, low sensitivity, etc., and achieve the effect of fast response speed, simple incident light field and high fault tolerance rate

Active Publication Date: 2020-07-24
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Claims
  • Application Information

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Problems solved by technology

[0004] In view of the above-mentioned shortcomings of the prior art, the present invention provides a displacement sensing device based on the Bloch surface wave one-way coupling effect, which solves the problems of low sensitivity, small range and complex incident light field of the existing displacement sensing device

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Embodiment Construction

[0023] Below, in conjunction with the accompanying drawings, preferred embodiments of the present invention are given and described in detail, so that the functions and features of the present invention can be better understood.

[0024] Such as figure 1 As shown, a displacement sensing device 1 based on the Bloch surface wave unidirectional coupling effect of the present invention includes a leakage radiation microscope system 10 and a Bloch surface wave (BSW) unidirectional Couple chip 20 . Among them, the leakage radiation microscope system 10 includes a laser 101, a lens group 102, a polarizer 103, a half glass plate 104, an incident objective lens 105, a piezoelectric ceramic displacement platform 106, a collecting objective lens 107, a collecting lens 108, and an imaging The camera 109 and the Bloch surface wave one-way coupling chip 20 are located on the piezoelectric ceramic displacement platform 106 .

[0025] The laser 101 of the present invention is a supercontinu...

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Abstract

The invention relates to a displacement sensing device based on a Bloch surface wave one-way coupling effect. The device comprises a leakage radiation microscopy system, the leakage radiation microscopy system sequentially comprises a laser, a lens group, a polarizing film, a half slide, an incident objective lens, a displacement platform, a collection objective lens, a collection lens and an imaging camera along the trend of optical signals, a displacement sensing chip is arranged on the displacement platform, and the displacement sensing chip is a Bloch surface wave one-way coupling chip. According to the invention, the used incident light field is simple, vector beam shaping is not needed, and the extinction ratio of Bloch surface light field changes drastically along with the relativedisplacement of the incident light field and the chip, so that the sensing sensitivity and precision are high, and the response speed is high. Meanwhile, the measuring range is also increased. Besides, the Bloch surface wave one-way coupling chip used in the invention is of an all-dielectric structure, is easy to store and high in repeated utilization rate, has a high error-tolerant rate, is easyto process, and reduces the processing difficulty.

Description

technical field [0001] The invention relates to the field of optical sensing, in particular to a displacement sensing device based on the one-way coupling effect of Bloch surface waves. Background technique [0002] Optical metrology and position sensing technologies play a key role in many fields of modern science and technology, such as gravitational wave detection, molecular conformational change sensing, and scanning probe microscopy. Although diffraction limits the optical resolution, optical techniques are still useful in many ways due to their non-contact capabilities. Researchers have realized deep subwavelength displacement sensing with active and passive methods. Active methods include Foster resonance energy transfer method and second harmonic method. Passive methods include traditional macroscopic interferometers, nanoantennas Directional scattering, near-field interference, localized plasmon resonance, electromagnetic field singularities and optical skyrmions, ...

Claims

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Application Information

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IPC IPC(8): G01B11/02
CPCG01B11/02
Inventor 王茹雪武爱民
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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