Etching solution and etching replenishing solution for copper/molybdenum (niobium)/IGZO film layer, and preparation methods and application of etching solution and etching replenishing solution
A technology for etching solution and replenishing solution, which is applied in chemical instruments and methods, semiconductor/solid-state device manufacturing, surface etching compositions, etc., and can solve the problems of large manpower, material and time costs, and high overall cost of panel enterprises.
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Embodiment 1
[0070] The etching solution for copper / molybdenum (niobium) / IGZO film layer of the present embodiment comprises the following components according to mass percentage:
[0071]
[0072] The above-mentioned components were mixed and stirred uniformly under the atmosphere not exceeding 50° C., and after passing through filtration, the etching solution for copper / molybdenum (niobium) / IGZO film layer of this embodiment was obtained. The pH value of the etching solution is 3.80.
[0073] The etching replenishment solution for the copper / molybdenum (niobium) / IGZO film layer of the present embodiment comprises the following components according to mass percentage:
[0074]
[0075]
[0076] The above components were mixed and stirred uniformly under the atmosphere not exceeding 50° C., and then filtered to obtain the copper / molybdenum (niobium) / IGZO film layer etching supplement solution of this embodiment. The pH of the etch replenisher was 3.45.
Embodiment 2
[0078] The etching solution for copper / molybdenum (niobium) / IGZO film layer of the present embodiment comprises the following components according to mass percentage:
[0079]
[0080] The above-mentioned components were mixed and stirred uniformly under the atmosphere not exceeding 50° C., and after passing through filtration, the etching solution for copper / molybdenum (niobium) / IGZO film layer of this embodiment was obtained. The pH value of the etching solution is 3.70.
[0081] The etching replenishment solution for the copper / molybdenum (niobium) / IGZO film layer of the present embodiment comprises the following components according to mass percentage:
[0082]
[0083]
[0084] The above components were mixed and stirred uniformly under the atmosphere not exceeding 50° C., and then filtered to obtain the copper / molybdenum (niobium) / IGZO film layer etching supplement solution of this embodiment. The pH of the etch replenisher was 3.40.
Embodiment 3
[0086] The etching solution for copper / molybdenum (niobium) / IGZO film layer of the present embodiment comprises the following components according to mass percentage:
[0087]
[0088] The above-mentioned components were mixed and stirred uniformly under the atmosphere not exceeding 50° C., and after passing through filtration, the etching solution for copper / molybdenum (niobium) / IGZO film layer of this embodiment was obtained. The pH value of the etching solution is 3.90.
[0089] The etching replenishment solution for the copper / molybdenum (niobium) / IGZO film layer of the present embodiment comprises the following components according to mass percentage:
[0090]
[0091] The above components were mixed and stirred uniformly under the atmosphere not exceeding 50° C., and then filtered to obtain the copper / molybdenum (niobium) / IGZO film layer etching supplement solution of this embodiment. The pH of the etch replenisher was 3.40.
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