A Guard Ring for Gallium Nitride-Based Active Devices
An active device, GaN-based technology, applied in semiconductor devices, electric solid-state devices, semiconductor/solid-state device components, etc., can solve the problems of mutual interference of active devices, high power, and deterioration of chip product performance. The effect of reducing parasitic resistance
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[0022] like Figure 1-Figure 2 As shown, the guard ring of a gallium nitride-based active device described in the present invention is arranged on the substrate of the chip, including an ohmic contact layer Oh-C that forms a closed ring, and a stacked layer arranged on the ohmic contact layer on the first metal layer Met1. The first metal layer is connected to the upper second metal layer through a vertical through hole, and the second metal layer is provided with a microstrip line, and the microstrip line is electrically connected to the ground via hole after being connected in series with a lumped capacitor. Active devices can be arranged in the space surrounded by the ohmic contact layer and the first metal layer. The active device in this embodiment takes GaN HEMT as an example.
[0023] The ohmic contact layer and the first metal layer form an absorbing ring for high-frequency noise, which can be the high-frequency noise that diffuses outward in the absorbing ring, and ...
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