Trapezoidal gallium nitride micron wire array photoelectric detector and preparation method thereof
A technology of photodetectors and micron wires, which is applied in circuits, electrical components, semiconductor devices, etc., can solve the problems of large dark current and achieve the effects of high on/off current ratio, high crystal quality, and wide detection range
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Embodiment 1
[0042] See figure 1 , figure 1 It is a schematic flow chart of a preparation method of a trapezoidal gallium nitride micro-line array photodetector provided by an embodiment of the present invention, including:
[0043] S1. Provide a silicon substrate. Specifically, the present embodiment adopts a 2-inch intrinsic type silicon wafer as a substrate, and the silicon substrate is a high-resistance silicon wafer (resistivity > 10 5 Ω·cm), the crystal orientation of the silicon wafer is .
[0044] S2. Depositing a silicon dioxide insulating layer on the silicon carbide substrate; in this embodiment, a 200nm silicon dioxide insulating layer can be formed on the surface of a 2-inch silicon wafer by thermal reduction.
[0045] S3. Etching the silicon dioxide insulating layer to form several groove structures for growing micron wires, wherein the width of the groove structure is 5-10 μm, and the depth of the groove structure is 3.5-5 μm, every two The spacing between groove structur...
Embodiment 2
[0057] See Figure 2-Figure 7 , the trapezoidal GaN micro-line array photodetector of this embodiment can be prepared by the method of Embodiment 1, and the device includes:
[0058] silicon substrate 10;
[0059] A silicon dioxide insulating layer 20 is formed at intervals on the silicon substrate 10, so that a plurality of groove structures 201 are formed on the substrate not covering the silicon dioxide insulating layer 20;
[0060] Gallium nitride microwires 30 are formed in the groove structure 201, and the extension direction of the gallium nitride microwires 30 is consistent with the extension direction of the groove structure 201, and the gallium nitride microwires 30 are higher than the two A silicon oxide insulating layer 20, wherein there are multiple gallium nitride micro-wires 30 in an array shape;
[0061] The aluminum nitride buffer layer 50 is formed inside the gallium nitride micro-wire 30 of the groove structure 201; the aluminum nitride buffer layer 50 can...
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