Device and method for measuring atomic oxygen flux density

Abstract

The invention discloses a device and a method for measuring atomic oxygen flux density. The device provided by the invention comprises a tray, an interlayer and a cover plate; the tray is provided with a plurality of first concave holes for placing samples, and the first concave holes are arranged in an axial symmetry manner by taking the symmetry axis of the tray as the symmetry axis; the first concave holes are the same in shape and size; in the using state, the samples are placed in the first concave holes of the tray, and then the interlayer and the cover plate are sequentially placed on the tray. According to the invention, lateral erosion of atomic oxygen to a test sample in the atomic oxygen density measurement test process can be effectively solved, the flux density of atomic oxygen can be accurately measured, the uniformity of the flux density of atomic oxygen can be accurately measured, the deviation of the flux density of atomic oxygen is reduced, the accuracy of atomic oxygen test data is improved, and research and development, application and development progress of aerospace products are promoted.

Description

technical field [0001] The invention relates to the technical field of spacecraft environment simulation, in particular to a device and method for measuring atomic oxygen flux density. Background technique [0002] At the orbital height of 200-1000km in space, atomic oxygen is the most abundant component of space gas, accounting for about 80%. Atomic oxygen is produced by the photodissociation of residual oxygen molecules in space by solar ultraviolet light with a wavelength of less than 240nm, and is one of the most dangerous environmental factors in low earth orbit. Atomic oxygen has high chemical activity, and its oxidation effect is much greater than that of oxygen molecules. Atomic oxygen will corrode spacecraft materials exposed to the space environment. When atomic oxygen interacts with the surface of the spacecraft, it will form crack initiation points on the surface of the material, causing denudation, degrading the performance of the material, and affecting the no...

AI Technical Summary

Problems solved by technology

[0005] The patent application number 201010523070.7 for the measurement method of atomic oxygen flux density proposes a method of using solar cells as detector probes to obtain atomic oxygen flux density by measuring the change of battery open circuit current. This method is relatively complicated in technology and high in cost , not applicable to ground simulation tests; the patents of application number 201810745850.2 and application number 200910235752.5 use graphene oxide film as the sensitive layer of the atomic oxygen sensor, and calculate the atomic oxygen flux density by measuring the resistance change of the sensitive layer. The requirements are high, and the uniformity of atomic oxygen flux density cannot be measured; application number 201710780829.1 is a patent for atomic oxygen integral flux measurement method and atomic oxygen sensor. It is sensitive to ambient temperature and cannot measure the uniformity of atomic oxygen when applied to atomic oxygen ground simulation equipment

The document "The Effect of Atomic Oxygen on Metallic Copper" proposed a tool that can measure the flux density of atomic oxygen by using the Kapton film mass loss method, but the device is prone to atomic oxygen side erosion, resulting in inaccurate measurement results and uniformity of measurement results. poor

[0006] At present, the research on the measurement method of atomic oxygen flux density has not put forward requirements on the uniformity of atomic oxygen in the ground simulation system or the uniformity of the measurement results is poor, and the measurement method proposed is relatively complicated or costly

Images