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Sensor, X-ray detector and application thereof

A sensor, X-ray technology, applied in the field of sensors, can solve the problems of stacking, signal crosstalk, low detection efficiency, etc., to achieve the effect of enhancing the signal-to-noise ratio, improving performance, and increasing the area of ​​the sensitive area

Pending Publication Date: 2022-08-09
SHANGHAI TECH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of the shortcomings of the prior art described above, the object of the present invention is to provide a sensor, an X-ray detector and its application, which are used to solve the problems of signal crosstalk, stacking, or low detection efficiency in the X-ray detector in the prior art. question

Method used

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  • Sensor, X-ray detector and application thereof
  • Sensor, X-ray detector and application thereof
  • Sensor, X-ray detector and application thereof

Examples

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Embodiment 1

[0066] This embodiment provides a sensor, such as figure 1 , figure 2 and image 3 As shown, they are a schematic three-dimensional structure of the sensor, a schematic plan view of the sensor along the XZ plane, and a schematic cross-sectional structure of the sensor along the YZ plane, including a plurality of sensing units 11 and a shielding layer 12, wherein, A plurality of the sensing units 11 are arranged at intervals in the Y direction, and at least one of the sensing units includes a first electrode layer 111 , a sensor layer 112 and a second electrode layer 113 arranged in sequence along the Y direction. An electrode layer 111 includes a plurality of collector electrodes 1111 arranged in sequence along the X direction, the second electrode layer 113 includes at least one cathode 1131, the X direction is perpendicular to the Y direction; the shielding layer 12 is located adjacent to between the two sensing units.

[0067] As an example, the material of the sensor l...

Embodiment 2

[0094] This embodiment provides an X-ray detector, such as Figure 10 and Figure 11 Shown is a schematic three-dimensional structure diagram of a structure of the X-ray detector and a cross-sectional structure diagram of the X-ray detector along the YZ plane, including a sensor 1 and at least one dedicated integrated chip 2, wherein all the The sensor 1 adopts the sensor in the first embodiment, and the dedicated integrated chip 2 is located below the sensor 1 .

[0095] Specifically, the dedicated integrated chip 2 is an integrated circuit chip designed and prepared for the sensor 1 and used to process the signal generated in the sensor 1, and the dedicated integrated chip 2 can be used for energy integration X-ray Signal processing of detectors or photon-counting X-ray detectors.

[0096] As an example, as Figure 12 As shown, it is a schematic plan view of the X-ray detector along the XZ plane, and an adapter plate 21 is provided between the X-ray detector 1 and the ded...

Embodiment 3

[0115] This embodiment provides an application of an X-ray detector, such as Figure 16 and Figure 17 As shown, the system module diagram of the X-ray detector applied to X-ray imaging and the system module diagram of the X-ray detector applied to CT imaging are respectively, the application uses the X-ray detection in the second embodiment The device is used in CT or X-ray imaging.

[0116] Specifically, when the X-ray detector is applied to CT, X-ray imaging or other X-ray imaging equipment, through the arrangement of the collecting electrode 1111 and the drift electrode 1112 in the sensor 1 , it is possible to reduce the amount of time in the device. Signal crosstalk and electrical signal crosstalk caused by the Compton effect during imaging, while enhancing the signal-to-noise ratio, preventing signal stacking, reducing input capacitance, reducing signal waveform width and improving signal uniformity. image quality of the device.

[0117] In the application of the X-ra...

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Abstract

The invention provides a sensor, an X-ray detector and application thereof, the sensor comprises a sensing unit and a shielding layer which are sequentially arranged at intervals in the Y direction, and the sensing unit comprises a first electrode layer, a sensor layer and a second electrode layer which are sequentially arranged in the Y direction; the first electrode layer comprises a plurality of collecting electrodes which are sequentially arranged at intervals in the X direction and used for collecting signals; at least one drift electrode is arranged between two adjacent collecting electrodes at intervals to reduce the area of the collecting electrodes, so that the input capacitance is effectively reduced, the signal waveform width is reduced, the signal uniformity is improved, and the performance of the detector is improved; the sensor layer comprises one of gallium arsenide, chromium compensation gallium arsenide, chromium-doped gallium arsenide or aluminum-doped gallium arsenide; the second electrode layer comprises at least one cathode; and the shielding layer is located between two adjacent sensing units, comprises at least one of physical shielding and electric shielding, and is used for preventing signal crosstalk.

Description

technical field [0001] The invention belongs to the field of X-ray detectors, and relates to a sensor, an X-ray detector and applications thereof. Background technique [0002] Computed Tomography (CT for short) is to use X-ray beams, gamma rays, etc., together with highly sensitive detectors, to scan one part of the object one by one. It has the characteristics of fast scanning time and clear images. Widely used in medical inspection, industrial inspection, security inspection, etc. [0003] At present, the commonly used CT detectors are usually energy integration detectors and photon counting detectors, but energy integration detectors are difficult to have no energy resolution capability, high electronic noise, low weight of low-energy photons, and poor contrast; photon counting detectors have low-energy photons. No weight reduction, fixed spectral sensitivity, immunity to electronic noise, and higher spatial resolution, improve image contrast, reduce radiation dose, imp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/24G01N23/046A61B6/00A61B6/03
CPCG01T1/241G01N23/046A61B6/035A61B6/4208
Inventor 钟韬秦文辉余肖鹏赖晓春
Owner SHANGHAI TECH UNIV