155 M bit error code analysis tester based on field programmable gate array

Abstract

This invention discloses a 155M error analysis tester based on a site programmable gate array composed of a tested device, a clock data extraction and recover chip, a clock synthetic chip, a site programmable gate array chip, a single-chip processor, a liquid crystal display screen, a bit error pilot lamp, a film key board and a serial communication interface. The site programmable gate array includes a count module.

Description

technical field [0001] The invention relates to a code error analysis tester in the field of optical communication instrument and meter testing; in particular, it relates to a field programmable gate array, which realizes the sending, receiving and code error of a pseudo-random code sequence through the field programmable gate array Detection and counting, so that it is convenient, fast and accurate to perform error analysis and testing. Background technique [0002] In the communication system, the bit error rate is a very important index. With the continuous development of communication technology, the transmission rate is getting higher and higher, and the rate of bit error testing is also increasing. At present, the price of foreign instruments with the same performance, such as Agilent 522A in the United States, is too high, and the test rate of the domestic Silicon Valley Communication SGT-1BS is generally below 2M, which cannot meet the current FTTH (Fiber To The Hom...

AI Technical Summary

Problems solved by technology

[0004] 1. Pseudo-random code sequence

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