Structure for improving Schottky performance of grid electrode of gallium nitride based transistor in high electron mobility
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
- Publication Date
- 2006-07-05
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of semiconductors, in particular to a structure for improving the Schottky performance of the gallium nitride-based high electron mobility transistor gate. Background technique
[0002] Group III-V gallium nitride (GaN) and its compound semiconductor materials, as typical representatives of the third-generation semiconductor materials, have great application prospects in the fields of optoelectronics and microelectronics due to their unique physical, chemical and mechanical properties. Due to the large band gap, high breakdown electric field, good chemical stability, high electron saturation velocity and peak velocity, and strong radiation resistance of GaN-based materials, aluminum gallium nitride / gallium nitride (AlGaN / GaN) High Electron Mobility Transistor (HEMT) has become the most dazzling new star in the field of microelectronics applications, and is expected to play an important role in aerospace, hig...