Semiconductor device, manufacturing method thereof, and data processing system
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[0047]The semiconductor device according to the third embodiment relates to a case in which the configuration of this invention is applied to a logic circuit. In the logic circuit, a first wiring layers 31, a second wiring layer 15 and a third wiring layer 32 are illustrated. These wiring layers may be formed of a material such as tungsten, aluminum, or copper. The semiconductor device 10B is manufactured by a process as described below. Firstly, element isolation regions 12 are formed to define active regions on a semiconductor substrate 11 by a STI process used in a conventional manufacturing process of semiconductor devices. Then, a MISFET (not shown) having a source / drain diffusion layer and a gate electrode is formed in each of the active regions. Subsequently, a silicon oxide film is formed by CVD or the like and planarized by CMP to thereby form a first interlayer insulation film 14a.
[0048]In the next step, photolithography and dry etching are performed to form contact holes...
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