The application relates to the field of
image processing, in particular to a spunlace non-
woven fabric defect intelligent identification method and
system, which comprises the following steps: dividing a standard non-defect spunlace non-
woven fabric image into multiple local image blocks according to spatial positions; constructing a
local spectrum prior atlas corresponding to the image spatial positions; performing block
processing on a to-be-detected image to obtain multiple original image blocks, and dynamically generating a personalized
frequency domain mask for each original image block based on the
local spectrum prior atlas to suppress the
frequency band corresponding to normal textures; constructing a preliminary defect residual graph and a spectrum graph thereof; in response to the proportion of the medium-
low frequency region energy in the
total frequency domain energy in the spectrum graph exceeding a preset threshold, updating the
mask parameters, applying the updated
mask parameters to the personalized
frequency domain mask, and obtaining a final defect residual graph; performing threshold segmentation and / or connected
domain analysis on the final defect residual graph, and outputting a defect position. The application has the effect of improving defect detection accuracy.