Polysilicon thin film transistor and method of fabricating the same
A technology of polysilicon thin film and amorphous silicon thin film, applied in the direction of transistor, semiconductor/solid-state device manufacturing, manufacturing tools, etc., can solve the problem that CW laser is not suitable for mass production
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[0040] Hereinafter, a method of manufacturing a polysilicon panel for a thin film transistor according to an embodiment will be described in detail with reference to the accompanying drawings.
[0041] In this method, an amorphous silicon thin film deposited on a panel is converted into a polysilicon thin film by scanning a combined laser beam comprising a wavelength range of about 600 nm to about 900 nm (specifically, in the red visible light range and near-infrared range) and pulsed laser beams having a wavelength range of about 100 nm to about 550 nm, specifically, between the visible range and the ultraviolet range. A continuous wave (CW) oscillating laser beam may have a wavelength of about 600nm, 610nm, 620nm, 630nm, 640nm, 650nm, 660nm, 670nm, 680nm, 690nm, 700nm, 710nm, 720nm, 730nm, 740nm, 750nm, 760nm, 770nm, 780nm, 790nm , 800nm, 810nm, 820nm, 830nm, 840nm, 850nm, 860nm, 870nm, 880nm, 890nm, 900nm wavelength or a range including two or more of any of the above value...
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Abstract
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