Method for measuring reflectivity of dual-wavelength high reflecting mirror
A technology of high reflection mirror and measurement method, which is applied in the direction of testing optical performance, etc., and can solve the problems of device adjustment difficulty, reduction of output signal amplitude of optical cavity, and decrease of signal-to-noise ratio
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[0037] Attached below figure 1 The measurement system describes the method for measuring the reflectivity of the dual-wavelength high-reflector of the present invention. figure 1 Middle: 1, 2 are laser light sources with two different wavelengths, 3 is a reflector, 4 is a double-beam beam splitter, 5 and 6 are plano-concave dual-wavelength high-reflection mirrors, 7 is a focusing lens, 8 is a photodetector, 9 is a computer, 10 is a data acquisition card, 11 is a function generation card, 12 is a visible auxiliary alignment light source, 13 is a beam splitter, and 14 is a reflector. The thick line in the figure is the optical path, and the thin line is the connection line.
[0038] Both light sources 1 and 2 are continuous semiconductor lasers, and the two semiconductor lasers are output by square wave modulation; the two laser beams are combined through the mirror 3 and the double beam splitter 4, so that they are injected into the ring-down cavity at the same time; two plano-...
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