Analyzer for synchronously measuring in-situ laser mass spectrum and light spectrum

A technology of laser mass spectrometry and simultaneous measurement, which is applied in the field of elemental analyzers, can solve the problems of no literature reports, lower analysis efficiency, and inability to obtain mass spectra at one time, and achieve strong analysis capabilities, high detection accuracy, and improve the ability to identify and analyze organic substances.

Inactive Publication Date: 2014-12-24
INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, because they used a quadrupole mass spectrometer, they could not obtain all the mass spectra at one time. In their published experiments, only the H(α) spectrum and C + Mass spectromet

Method used

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  • Analyzer for synchronously measuring in-situ laser mass spectrum and light spectrum
  • Analyzer for synchronously measuring in-situ laser mass spectrum and light spectrum
  • Analyzer for synchronously measuring in-situ laser mass spectrum and light spectrum

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0027] Example 1: see figure 1, an in-situ laser mass spectrometry spectrum synchronous measurement analyzer, which is mainly characterized in that it includes a laser beam of a target sample 1 arranged in a laser optical system, a central axis in a laser time-of-flight mass spectrometry measurement device, and a laser-induced breakdown spectroscopy measurement device. On the intersection point of the lens group axes; the laser optical system includes a laser 24, and an ultraviolet quartz prism 6, an ultraviolet quartz focusing lens 5 and a characteristic wavelength high reflector 3 are arranged on the laser beam transmission channel, and the laser pulse is focused on the target sample A plasma plume 2 is generated on the surface of the 1; in order to precisely control the focal position of the laser beam, a monitor CCD4 and a positioning semiconductor laser 9 for the target sample 1 are also provided at the front end of the vacuum chamber 22 of the laser time-of-flight mass sp...

Example Embodiment

[0028] Example 2: see figure 1 , the in-situ laser mass spectrometry spectrum synchronous measurement analyzer, the laser time-of-flight mass spectrometry measurement device comprises a cylindrical linear high vacuum chamber 22, the top of which is provided with a pulse intake valve 8; in the high vacuum chamber 22 The front end is sequentially provided with a central perforated metal anode sheet 19, a central perforated microchannel plate (MCP) 20, and a grid 21 welded into a mesh structure by metal wires, and at its rear end is provided with a circular hole in the center. The deceleration and acceleration electric field area formed by the metal electrode sheet 18 is the drift area of ​​the vacuum chamber between the grid 21 and the metal electrode sheet 18; a signal output interface 23 is provided on the flange at the bottom of the high vacuum chamber 22, and the cable passes through it. The line is connected with the acquisition channel of the oscilloscope; the vacuum chamb...

Example Embodiment

[0030] Example 3: see figure 1 , the in-situ laser mass spectrometry spectrum synchronous measurement analyzer, the laser-induced breakdown spectrum measurement device includes a spectrum collection coupling system 10 composed of a quartz lens, the lens group axis points to the target sample 1, and the optical fiber 12 is connected to the spectrometer 13 , the output end of the spectrometer 13 is connected to the multi-channel pulse signal delayer 16 . The spectrum emitted by the plasma plume 2 generated on the surface of the target sample 1 is efficiently collected and then transmitted to the spectrometer 13 through the optical fiber 12, so that the elemental composition information of the target sample 1 can be obtained through spectral analysis. The rest of the structure is the same as that of Embodiment 1 and Embodiment 2.

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PUM

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Abstract

The invention relates to an elemental analyzer and in particular relates to a laser ablation flight time mass spectrum analyzer and a laser-induced breakdown light spectrum analyzer. An analyzer for synchronously measuring in-situ laser mass spectrum and light spectrum is mainly characterized in that a target sample is arranged a cross point of a laser beam of a laser optical system, a central axis of a laser flight time mass spectrum measuring device and an axis of a lens set of a laser induced breakdown light spectrum measuring device, wherein the laser optical system comprises a laser device; an ultraviolet quartz prism, an ultraviolet quartz focusing lens and a high characteristic wavelength reflector are arranged on a laser beam transmitting channel; each laser pulse is focused on the surface of the target sample and used for generating a plasma plume; in order to accurately control the laser beam focusing position, a monitor CCD and a target sample positioning semiconductor laser device are also arranged at the front end of a vacuum chamber of the laser flight time mass spectrum measuring device; the target samples are respectively arranged on two sides of a target sample axis, an axis of the CCD and an axis of the positioning semiconductor laser device. The analyzer for synchronously measuring the in-situ laser mass spectrum and light spectrum has the advantage that information of the mass spectrum and the light spectrum of ablation products can be obtained under the same ablation condition by ablating target materials under the same condition by virtue of the same beam of laser.

Description

technical field [0001] The invention relates to an element analyzer, in particular to a laser ablation time-of-flight mass spectrometer and a laser-induced breakdown spectrometer. Background technique [0002] Material composition analysis has a wide range of application requirements in various fields such as metallurgy, food safety, environmental monitoring, and space exploration. Commonly used analysis methods include X-ray fluorescence analyzer, inductively coupled plasma spectrometer, inductively coupled plasma mass spectrometer, atomic absorption spectrophotometer, isotope mass spectrometer, inorganic mass spectrometer and organic mass spectrometer, etc. However, most elemental analysis instruments require sampling and pretreatment of the samples before they can be analyzed. Some analysis methods have relatively large restrictions on the shape of the sample, the types of elements to be analyzed, and the types of molecules. [0003] Laser Induced Breakdown Spectroscopy ...

Claims

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Application Information

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IPC IPC(8): G01N21/63G01N27/64
Inventor 张大成马新文李斌
Owner INST OF MODERN PHYSICS CHINESE ACADEMY OF SCI
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