Preparation method of amorphous indium tin oxide thin film

A technology of indium tin oxide and thin film, which is applied in the field of preparation of amorphous indium tin oxide thin film, which can solve problems affecting processing and use, uneven film quality of indium tin oxide thin film, and difficulty in uniform dispersion of water vapor.

Inactive Publication Date: 2016-08-10
YICHANG NANBO DISPLAY
View PDF5 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the following problems exist in the method of introducing a certain proportion of water vapor during the deposition process of indium tin oxide: 1. The water vapor in the vacuum chamber is difficult to disperse evenly, which leads to uneven film quality of the indium tin oxide film; 2. The water pressure needs to be accurate. Control, and its control requires expensive monitoring equipment and other issues. In addition, the indium tin oxide film prepared by it still has a small amount of crystallization in the weather resistance test, which affects subsequent processing and use.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Preparation method of amorphous indium tin oxide thin film
  • Preparation method of amorphous indium tin oxide thin film
  • Preparation method of amorphous indium tin oxide thin film

Examples

Experimental program
Comparison scheme
Effect test

preparation example Construction

[0019] like figure 1 The preparation method of the amorphous indium tin oxide thin film of one embodiment shown includes the following steps:

[0020] S10, providing a substrate.

[0021] The material of the substrate is glass, aluminum oxide, polyethylene terephthalate (PET) or polyimide (PI).

[0022] S20. Place the substrate obtained in S10 in the chamber of a magnetron sputtering device, under vacuum conditions, use an argon-hydrogen mixed gas with a hydrogen volume percentage of 1% to 3% as the process gas, and use indium tin oxide as the process gas For the target material, the temperature of the substrate is controlled at -50°C to 100°C, and an amorphous indium tin oxide film is deposited on the substrate by magnetron sputtering.

[0023] The vacuum degree of vacuum condition can be 1×10 -6 Pa~2×10 -4 Pa. Preferably, the degree of vacuum under vacuum conditions is 9×10 -5 Pa.

[0024] Preferably, the process gas is an argon-hydrogen mixed gas with a hydrogen cont...

Embodiment 1

[0031] Supplied with a PET substrate.

[0032] Put the PET substrate in the cavity of the magnetron sputtering equipment, and the vacuum degree is 9×10 -5 Under the vacuum condition of Pa, the process gas is argon-hydrogen mixed gas with a hydrogen volume percentage of 2.2%, and indium tin oxide with a mass content of indium oxide of 90% is used as a target material, and the temperature of the PET substrate is controlled at room temperature , Depositing amorphous indium tin oxide thin films on PET substrates by magnetron sputtering.

Embodiment 2

[0034] A glass substrate is provided.

[0035] Place the glass substrate in the cavity of the magnetron sputtering equipment at a vacuum of 1×10 -6 Under the vacuum condition of Pa, with argon-hydrogen mixed gas with a volume percentage of hydrogen of 3% as the process gas, and indium tin oxide with a mass content of indium oxide of 85% as the target material, the temperature of the glass substrate is controlled at 100 ℃, magnetron sputtering deposited amorphous indium tin oxide thin film on the glass substrate.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for preparing an amorphous indium tin oxide thin film, which comprises the following steps: providing a substrate; and placing the substrate in a cavity of a magnetron sputtering device; Argon-hydrogen mixed gas with a content of 1% to 3% is used as the process gas, and indium tin oxide is used as the target material, the temperature of the substrate is controlled to be -50°C to 100°C, and magnetron sputtering is performed on the substrate An amorphous indium tin oxide film is deposited. The preparation method of this amorphous indium tin oxide thin film adopts the indium tin oxide target material (mass ratio of indium oxide is 85%~93%) used in the conventional crystalline indium tin oxide film, and the volume of hydrogen gas is used in the indium tin oxide coating process The argon-hydrogen mixed gas with a percentage content of 1% to 3% is the process gas. The hydrogen has good dispersibility and is conducive to uniform distribution. There is no need to add expensive testing equipment to monitor the water pressure. The prepared amorphous indium tin oxide film is excellent. stability.

Description

technical field [0001] The invention relates to the field of vacuum coating, in particular to a method for preparing an amorphous indium tin oxide thin film. Background technique [0002] Indium tin oxide (indium tin oxide) thin film, as the most commonly used transparent conductive film, is widely used in the field of transparent display. Crystalline indium tin oxide thin films generally need to be prepared at high temperatures (>200°C), and subsequent pattern processing often requires aqua regia to etch. However, the etching of crystalline indium tin oxide film requires strong acid, and its process control is difficult. The etching process is easy to damage other film layers or product components, and at the same time, the environmental pollution and damage to the production line are relatively large. [0003] The amorphous indium tin oxide thin film has low deposition temperature, easy etching, and low damage to the product during the etching process, which has obviou...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/35C23C14/08
CPCC23C14/35C23C14/086
Inventor 马志锋刘玉华张莉
Owner YICHANG NANBO DISPLAY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products