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High-sensitivity splicing CZT detector and sensitivity calibration method

A high-sensitivity, detector technology, used in radiation intensity measurement, instrumentation, radiation measurement, etc., can solve the problems of reduced ray deposition energy, lower detector sensitivity limit, and difficulty in obtaining large-sized single-crystal CZT materials. The effect of practicality, high sensitivity, and fast time response characteristics

Active Publication Date: 2016-12-21
NORTHWEST INST OF NUCLEAR TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the use of thin crystals reduces the deposition energy of rays in the crystals, resulting in a lower upper limit of detector sensitivity
[0004] The limitation of crystal quality on material volume makes it extremely difficult to obtain large-size single-crystal CZT materials, which limits the sensitivity range of CZT detectors

Method used

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  • High-sensitivity splicing CZT detector and sensitivity calibration method
  • High-sensitivity splicing CZT detector and sensitivity calibration method
  • High-sensitivity splicing CZT detector and sensitivity calibration method

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Embodiment Construction

[0050] The present invention will be further described below in conjunction with the drawings.

[0051] Such as figure 1 Shown is a schematic diagram of the structure of the high-sensitivity spliced ​​CZT detector of the present invention, which includes a sealed casing formed by successively fixing the front cover 1, the middle cylinder 2 and the rear cover 3 and the CZT semiconductor component fixed in the casing. The material of the sealed casing is Fe, and the inside is evacuated or filled with inert gas.

[0052] The CZT semiconductor component includes a substrate 5, a number of CZT single crystals 8 fixed on the substrate 5 by a sealant 6, and a planar electrode 9 respectively arranged on each CZT single crystal 8. The material of the planar electrode is gold and its area Consistent with the sensitive area of ​​the CZT single crystal, the thickness is 100nm±20nm. The planar electrode 9 includes a high-voltage electrode layer and a collecting electrode layer. The high-voltage...

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Abstract

The invention relates to a high-sensitivity splicing CZT detector and a sensitivity calibration method. The invention provides a high-sensitivity cadmium-zinc-telluride (CZT) semiconductor detector comprising a housing, an output signal circuit, and a CZT semiconductor assembly; and the housing is formed by successive and fixed connection of a front cover, a middle cylinder, and a rear cover. Therefore, the restriction on the CZT crystal dimension by the crystal growth technology can be eliminated; the sensitive volume of the pulse radiation detector can be increased; and the sensitivity range upper limit of the detector can be extended. In addition, a method for calibrating the sensitivity of the CZT detector is also provided by the invention.

Description

Technical field [0001] The invention relates to a radiation detection device, in particular to a current-type pulsed gamma radiation detector suitable for high-intensity pulsed gamma time spectrum measurement. Background technique [0002] Cadmium zinc telluride (CdZnTe, CZT for short) is a new room temperature compound semiconductor material with comprehensive advantages such as small size, high resistivity, and wider band gap. The small size makes CZT detectors have strong compatibility in group detection, and has great advantages in space detection; high resistivity and wide band gap make CZT detectors have a lower temperature at room temperature Dark current breaks through the low temperature application conditions of commonly used Si and Ge semiconductor detectors, effectively reducing the complexity of the detection system. Research on radiation detection technology based on CZT materials can provide new detection technology approaches for medical diagnosis, industrial fla...

Claims

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Application Information

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IPC IPC(8): G01T1/24G01T7/00
Inventor 韩和同陈翔傅录祥管兴胤陈彦丽卢毅易义成刘君红
Owner NORTHWEST INST OF NUCLEAR TECH
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