A method for measuring relative crystallinity of zsm-22 molecular sieve
A technology of relative crystallinity and molecular sieve, which is applied in the direction of measuring devices, analytical materials, material analysis using radiation diffraction, etc., to achieve the effect of reliable technical support
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[0049] The present invention is further illustrated by the following examples, but the present invention is not limited to these examples.
[0050] The embodiments of the present invention are described in detail below: the present embodiment is implemented under the premise of the technical solution of the present invention, and detailed implementation methods and processes are provided, but the protection scope of the present invention is not limited to the following embodiments, the following The experimental method that does not indicate specific condition in the embodiment, generally according to routine condition.
[0051] The signal-to-noise ratio of the weakest diffraction peak diffraction signal in the X-ray diffraction spectrum of the industrial sample to be measured:
[0052] In the present invention, the signal-to-noise ratio of the weakest diffraction peak diffraction signal in the X-ray diffraction spectrum of the industrial sample to be measured is not particu...
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Abstract
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