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A method for measuring relative crystallinity of zsm-22 molecular sieve

A technology of relative crystallinity and molecular sieve, which is applied in the direction of measuring devices, analytical materials, material analysis using radiation diffraction, etc., to achieve the effect of reliable technical support

Active Publication Date: 2019-07-05
PETROCHINA CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

All ZSM-22 molecular sieve preparation patents usually only list the XRD of the instrument used or the comparison between its XRD spectrum and its spectrum, crystallinity data, etc. when it comes to crystallinity analysis, and there is no detailed analysis process or method.

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  • A method for measuring relative crystallinity of zsm-22 molecular sieve
  • A method for measuring relative crystallinity of zsm-22 molecular sieve
  • A method for measuring relative crystallinity of zsm-22 molecular sieve

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Embodiment Construction

[0049] The present invention is further illustrated by the following examples, but the present invention is not limited to these examples.

[0050] The embodiments of the present invention are described in detail below: the present embodiment is implemented under the premise of the technical solution of the present invention, and detailed implementation methods and processes are provided, but the protection scope of the present invention is not limited to the following embodiments, the following The experimental method that does not indicate specific condition in the embodiment, generally according to routine condition.

[0051] The signal-to-noise ratio of the weakest diffraction peak diffraction signal in the X-ray diffraction spectrum of the industrial sample to be measured:

[0052] In the present invention, the signal-to-noise ratio of the weakest diffraction peak diffraction signal in the X-ray diffraction spectrum of the industrial sample to be measured is not particu...

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Abstract

The invention provides a method for determining the relative degree of crystallinity of a ZSM-22 molecular sieve. The method comprises the following steps of 1 sample pretreatment, wherein a standard ZSM-22 molecular sieve sample and a to-be-detected industrial sample are subjected to four substeps of grinding, sieving, roasting activation and temperature-control constant-humidity water absorption to prepare a to-be-detected standard specimen and a to-be-detected industrial specimen; 2 powder X-ray diffractometer working condition confirmation; 3 determination, wherein powder X-ray diffraction data is determined and collected; 4 calculation, wherein a chemometrics peak separation method of powder X-ray diffraction data processing system software is adopted, peak area integral intensity count values of four crystal plane diffraction peaks of specimens (021), (131), (330) and (400) are determined and subjected to summation, and the relative degree of crystallinity of the to-be-detected industrial specimen is calculated through an external standard method.

Description

technical field [0001] The patent of the present invention relates to a powder X-ray diffraction method for determining the crystallinity of molecular sieves, specifically a powder X-ray diffraction method for determining the relative crystallinity of ZSM-22 molecular sieves. Background technique [0002] Zeolite molecular sieves are widely used as catalysts or catalyst supports in the catalytic process of petrochemical industry. Relative crystallinity, unit cell parameters, silicon-aluminum ratio, purity, etc. are indispensable basic parameters to characterize the performance of molecular sieves. Therefore, it is very important to accurately determine the crystallinity of molecular sieves for designing molecular sieve preparation processes and evaluating the performance of related catalysts. The powder X-ray diffraction method has the advantages of simple sample preparation, short measurement time, good repeatability, high reliability and low cost, and is widely used in th...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20G01N23/2005
Inventor 李瑞峰谢彬王磊杨玉和
Owner PETROCHINA CO LTD