Preparation method for high-refractive index hydrogenated silicon film, high-refractive index hydrogenated silicon film, light filtering lamination and light filtering piece

A technology of high refractive index and hydrogenated silicon, which is applied in the preparation of high refractive index hydrogenated silicon thin films, high refractive index hydrogenated silicon thin films, filter stacks and filters, and can solve production instability, target poisoning, complex and other problems to achieve the effect of avoiding poisoning problems, less signal loss, and high signal-to-noise ratio

Active Publication Date: 2018-03-27
ZHEJIANG CRYSTAL OPTECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this technology adopts the principle of reactive sputtering, and there may be "poisoning" of the target material, that is, the target material is easily polluted by hydrogen gas, resulting in unstable production and other problems.
[0005] In order to produce a filter with low polarization effect, it is difficult for general sputtering equipment to prepare silicon hydrogenated silicon with a high refractive index of more than 2.5 and an extinction coefficient lower than 0.0005, and complex and special coating equipment must be used
However, the production efficiency of the coating machine made by the existing technology is low, which causes the cost of a single chip to remain high.

Method used

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  • Preparation method for high-refractive index hydrogenated silicon film, high-refractive index hydrogenated silicon film, light filtering lamination and light filtering piece
  • Preparation method for high-refractive index hydrogenated silicon film, high-refractive index hydrogenated silicon film, light filtering lamination and light filtering piece
  • Preparation method for high-refractive index hydrogenated silicon film, high-refractive index hydrogenated silicon film, light filtering lamination and light filtering piece

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preparation example Construction

[0055] According to a first aspect of the present invention, a method for preparing a high refractive index hydrogenated silicon film is provided, comprising the following steps:

[0056] (a) Deposit Si on the substrate by magnetron Si target sputtering to form a silicon film;

[0057] (b) The silicon film forms an oxygen-containing hydrogenated silicon film in an environment containing active hydrogen and active oxygen, and the amount of active oxygen accounts for 4 to 99% of the total amount of active hydrogen and active oxygen, or,

[0058] The silicon film forms a hydrogenated silicon film containing nitrogen in an environment containing active hydrogen and active nitrogen, and the amount of active nitrogen accounts for 5-20% of the total amount of active hydrogen and active nitrogen.

[0059] In step (a), the Si target is a semiconductor high-purity silicon material in the form of single crystal or polycrystal.

[0060] Typical but non-limiting substrates are, for exampl...

Embodiment 1

[0142] A method for preparing a high-refractive-index hydrogenated silicon film comprising the following steps:

[0143] (a) The clean substrate is placed on the roller with the coated side facing outward;

[0144] (b) The drum rotates at a constant speed in the coating chamber;

[0145] (c) When the vacuum degree is higher than 10 -4 At Pa, turn on the sputtering source and pass argon gas, the power of the sputtering source is 8KW, the argon gas is ionized to form plasma, and bombards the high-purity silicon target under the action of electricity and magnetic field, and the silicon material is sputtered onto the substrate;

[0146] (d) With the rotation of the drum, the substrate is brought to the reaction source area;

[0147] (e) Turn on the reaction source, the power of the reaction source is 2KW, hydrogen, oxygen and argon are fed into the reaction source area, and the gas flow rate is adjusted so that the volume percentage of the incoming oxygen accounted for the sum o...

Embodiment 2

[0149] A method for preparing a high-refractive-index oxygen-containing hydrogenated silicon film. In step (e), the volume percentage of the oxygen fed into the sum of the hydrogen and oxygen fed is 14%, and the rest of the steps and parameters are the same as in Example 1.

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Abstract

The invention discloses a preparation method for a high-refractive index hydrogenated silicon film, the high-refractive index hydrogenated silicon film, a light filtering lamination and a light filtering piece and relates to the technical field of optical films. The preparation method comprises the following steps that firstly, by means of magnetic controlled Si target sputtering, Si deposits on abase body, and a silicon film is formed; and secondly, the hydrogenated silicon film containing oxygen is formed through the silicon film under the environment where activated hydrogen and active oxygen are contained, the amount of the activated oxygen accounts for 4%-99% of the total amount of the activated hydrogen and the activated oxygen, or, the hydrogenated silicon film containing nitrogenis formed through the silicon film under the environment where the activated hydrogen and the activated nitrogen are contained, and the amount of the activated nitrogen accounts for 5%-20% of the total amount of the activated hydrogen and the activated nitrogen. According to the preparation method, sputtering and a reaction are separately conducted, firstly, by means of magnetic controlled Si target sputtering, Si deposits on the base body, then, plasmas of the activated hydrogen and the activated oxygen / nitrogen react with the silicon to obtain the oxygen or nitrogen containing SiH, the poisoning problem of a target is avoided, and the SiH film has a relatively high refractive index and relatively low absorption.

Description

technical field [0001] The invention relates to the technical field of optical thin films, in particular to a method for preparing a high-refractive-index hydrogenated silicon film, a high-refractive-index hydrogenated silicon film, a filter stack and an optical filter. Background technique [0002] Silicon hydrogenated thin films have attracted much attention due to their wide application prospects in microelectronic devices such as infrared imaging sensors, solar cells and thin film transistors. The preparation process of silicon hydride is mainly divided into chemical deposition methods, such as plasma enhanced chemical vapor deposition, etc.; physical deposition methods, such as radio frequency sputtering. [0003] In near-infrared imaging systems such as 3D, a narrow-band bandpass filter is used, which requires that even if the light is incident at a large angle, the offset of its central wavelength with the angle should be as small as possible, so as to ensure a wider ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/14C23C14/35C23C14/58G02B1/10G02B5/28
CPCG02B1/10G02B5/285C23C14/14C23C14/35C23C14/5826C23C14/5846C03C17/36C03C17/3636C03C17/3657C03C17/3678C03C17/22C03C2217/28C03C2218/155C03C2218/156C03C2218/31C03C2218/32C03C2217/734C03C17/3649C23C14/10C23C14/5853C23C14/0078C23C14/0036C23C14/5806G02B5/20C03C17/245C03C2217/213C03C2217/70C03C2218/154C23C14/0068C23C14/505C23C14/022
Inventor 张睿智唐健王迎余辉陆张武徐征驰张启斌
Owner ZHEJIANG CRYSTAL OPTECH
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