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53 results about "Silica hydride" patented technology

Preparation method for high-refractive index hydrogenated silicon film, high-refractive index hydrogenated silicon film, light filtering lamination and light filtering piece

The invention discloses a preparation method for a high-refractive index hydrogenated silicon film, the high-refractive index hydrogenated silicon film, a light filtering lamination and a light filtering piece and relates to the technical field of optical films. The preparation method comprises the following steps that firstly, by means of magnetic controlled Si target sputtering, Si deposits on abase body, and a silicon film is formed; and secondly, the hydrogenated silicon film containing oxygen is formed through the silicon film under the environment where activated hydrogen and active oxygen are contained, the amount of the activated oxygen accounts for 4%-99% of the total amount of the activated hydrogen and the activated oxygen, or, the hydrogenated silicon film containing nitrogenis formed through the silicon film under the environment where the activated hydrogen and the activated nitrogen are contained, and the amount of the activated nitrogen accounts for 5%-20% of the total amount of the activated hydrogen and the activated nitrogen. According to the preparation method, sputtering and a reaction are separately conducted, firstly, by means of magnetic controlled Si target sputtering, Si deposits on the base body, then, plasmas of the activated hydrogen and the activated oxygen / nitrogen react with the silicon to obtain the oxygen or nitrogen containing SiH, the poisoning problem of a target is avoided, and the SiH film has a relatively high refractive index and relatively low absorption.
Owner:ZHEJIANG CRYSTAL OPTECH

Thermoplastic silicone polyamide elastomers made of nylon resin

InactiveCN1446249AElastomerVulcanization
Disclosed is a method for preparing a thermoplastic elastomer, the method comprising: (I) mixing (A) a rheologically stable polyamide resin with a melting point or a glass transition temperature of 25°C to 275°C, (B) a mixture comprising the following substances Silicone base: (B') 100 parts by weight of pure diorganopolysiloxane rubber having a plasticity of at least 30 and containing an average of at least 2 alkenyl groups in its molecule and (B") 5-200 parts by weight Reinforcing filler, the weight ratio of the silicone base to the polyamide resin is greater than 35:65-85:15, (C) 0.1-5 parts by weight of hindered phenolic compound, relative to every 100 parts by weight of the polyamide and the silicon An oxane base, (D) an organic silicon hydride compound containing an average of at least 2 silicon-bonded hydrogen groups in its molecule and (E) a hydrosilylation catalyst, components (D) and (E) present in an amount sufficient to vulcanize the diorganopolysiloxane (B'); and (II) dynamically vulcanize the diorganopolysiloxane (B'), wherein at least one thermoplastic elastomer selected from tensile strength or elongation The thermoplastic elastomer has bulk properties at least 25% greater than the respective properties of a corresponding simple blend of diorganopolysiloxanes which are not vulcanized, and the thermoplastic elastomer has an elongation of at least 25%.
Owner:DOW CORNING CORP +1

Methods to form electronic devices and methods to form a material over a semiconductive substrate

A first electrode and a doped oxide layer laterally proximate thereof are provided over a substrate. A silicon nitride layer is formed over both the doped oxide layer and the first electrode to a thickness of no greater than 80 Angstroms over at least the first electrode by low pressure chemical vapor deposition using feed gases comprising a silicon hydride, H2 and ammonia. The substrate with silicon nitride layer is exposed to oxidizing conditions comprising at least 700° C. to form a silicon dioxide layer over the silicon nitride layer, with the thickness of silicon nitride over the doped oxide layer being sufficient to shield oxidizable substrate material beneath the doped oxide layer from oxidizing during the exposing. A second electrode is formed over the silicon dioxide layer and the first electrode. In one implementation, the chemical vapor depositing comprises feed gases of a silicon hydride and ammonia, with the depositing comprising increasing internal reactor temperature from below 500° C. to a maximum deposition temperature above 600° C. and starting feed of the silicon hydride into the reactor at a temperature less than or equal to 600° C. In one implementation the depositing comprises increasing internal reactor temperature from below 500° C. to a maximum deposition temperature above 600° C. using a temperature ramp rate of at least 10° C. / minute from at least 500° C. to at least 600° C. Other aspects and implementations are described.
Owner:THAKUR RANDHIR

3D structured light 940nm narrow-band optical filter and preparation method thereof

ActiveCN111638572AMeet the requirements of large angle and small offsetReduce offsetOptical elementsSilica hydrideRefractive index
The invention discloses a 3D structured light 940 nm narrow-band optical filter and a preparation method thereof; the optical filter includes a substrate, wherein a silicon oxide layer and a siliconhydride layer are alternately evaporated on one surface of the substrate; the other surface of the substrate is alternately evaporated with silicon oxide layers and silicon hydride layers, the total number of the silicon oxide layers and the silicon hydride layers on each surface is set to be 20-40, the thickness of the silicon oxide layer on each surface is set to be 1300-2000nm, and the thickness of the silicon hydride layer on each surface is set to be 400-800nm. According to the optical filter, the refractive index of silicon hydride can be controlled to 3.8-4.5, the refractive index of silicon dioxide can reach 1.4-1.6, and the requirement for large angle and small offset can be met; the adopted film system scheme is accurate in wavelength positioning and good in steepness; the spacelayer is made of a high-refractive-index silicon hydride material, and the coupling layer is made of a low-refractive-index silicon dioxide material, so that the offset caused by the angle effect is smaller than that caused by the low-refractive-index material.
Owner:苏州京浜光电科技股份有限公司

Method for preparing hydrogenated silicon carbon film coating by magnetron sputtering technology

The invention discloses a method for preparing a hydrogenated silicon carbon film coating by magnetron sputtering, which comprises the following steps of: pretreating a substrate, putting the pretreated substrate into magnetron sputtering coating equipment, taking a planar Si target and a planar C target as sources of corresponding elements, arranging the Si target and the C target on the inner wall of a furnace body in a target-to-target manner, and controlling the sputtering rate of the targets by adjusting the power of a medium-frequency pulse power supply; high-purity Ar is used as ionization gas, so that an effective glow discharge process is ensured; according to the method, high-purity H2 is adopted as a reaction gas, is ionized and is combined with Si and C elements, a hydrogenated silicon carbon film is deposited on the surface of a substrate, and the stoichiometric ratio of Si to C is changed through the change of the content of doped C, so that the photoelectric property of the film is changed. The prepared hydrogenated silicon carbon thin film can be widely applied to the aspects of solar cells, thin film transistors, light-emitting diodes, ultraviolet image sensors, fine superfluid coatings, anti-corrosion and anti-oxidation coatings and the like.
Owner:王志博
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