Preparation method of improved type back surface tunnel oxidization and passivation contact efficient battery
A technology of tunnel oxidation and tunnel oxide layer, which is used in the manufacture of circuits, electrical components, and final products, etc., can solve the problem of not greatly improving electrical performance, improve electrical performance parameters, improve open circuit voltage and conversion efficiency, reduce compound effect
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Embodiment 1
[0030] A method for making a high-efficiency cell with an oxidation passivation contact on the back side of the front emitter junction adopts the following steps:
[0031] (1) Remove the damaged layer of the silicon wafer in KOH alkali solution and make texture, and form a pyramid texture with 1 μm on both sides;
[0032] (2) In the boron source high-temperature diffusion furnace tube, the temperature is controlled at 850°C for 40 minutes to form low surface concentration B-doped p + launch junction;
[0033] (3) Use HF solution to remove borosilicate glass BSG layer, and use HNO 3 Mixed solution with HF for side insulation and back polishing;
[0034] (4) Using wet chemical method to grow an ultra-thin tunnel oxide layer SiO on the back of the silicon wafer 2 , whose thickness is less than 2nm, and then use the PECVD method to grow a P-doped polysilicon layer with a thickness of 20nm on it. This example uses fluorosilicate H 2 SiO 6 solution, the concentration is 1.3M, p...
Embodiment 2
[0041] A method for making a high-efficiency cell with an oxidation passivation contact on the back side of the front emitter junction adopts the following steps:
[0042](1) Remove the damaged layer and texture the silicon wafer in NaOH alkali solution, and form a pyramid texture with 2 μm on both sides;
[0043] (2) In the boron source high-temperature diffusion furnace tube, the temperature is controlled at 900°C for 30 minutes to form low surface concentration B-doped p + launch junction;
[0044] (3) Use HF solution to remove borosilicate glass BSG layer, and use HNO 3 Mixed solution with HF for side insulation and back polishing;
[0045] (4) Using wet chemical method to grow an ultra-thin tunnel oxide layer SiO on the back of the silicon wafer 2 , its thickness is less than 2nm, then use PECVD or other CVD methods to grow a P-doped polysilicon layer with a thickness of 30nm on it, the present embodiment adopts fluorosilicate H 2 SiO 6 solution, the concentration is...
Embodiment 3
[0051] A method for making a high-efficiency cell with an oxidation passivation contact on the back side of the front emitter junction adopts the following steps:
[0052] (1) Remove the damaged layer and texture the silicon wafer in NaOH alkali solution, and form a pyramid texture with 5 μm on both sides;
[0053] (2) In the boron source high-temperature diffusion furnace tube, the temperature is controlled at 1000 ° C for 20 minutes to form low surface concentration B-doped p + launch junction;
[0054] (3) Use HF solution to remove borosilicate glass BSG layer, and use HNO 3 Mixed solution with HF for side insulation and back polishing;
[0055] (4) Using wet chemical method to grow an ultra-thin tunnel oxide layer SiO on the back of the silicon wafer 2 , its thickness is less than 2nm, then use PECVD or other CVD methods to grow a P-doped polysilicon layer with a thickness of 50nm on it, the present embodiment adopts fluorosilicate H 2 SiO 6 Solution, the concentratio...
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