The application relates to a surface strengthening treatment process of a
semiconductor wafer and belongs to the technical field of
wafer treatment. First,
ozone water is used in cooperation with ultrasonic cleaning, organic pollutants are decomposed through the strong oxidizability of
ozone, inorganic particulate matters are removed through
ultrasonic cavitation effect, double purification is realized, and an
inert atmosphere is constructed by using
nitrogen blowing, so that an atomic-level clean substrate is provided for subsequent processes; second, vacuum
laser shallow layer repair is carried out, quasi-molecular
laser is used to induce lattice rearrangement, microcracks are eliminated,
surface roughness and
hardness are improved, and thermal stress deformation is avoided; subsequently,
radio frequency plasma chemical vapor deposition technology is used to form a high-density
amorphous silicon nitride barrier layer, so that the penetration of
alkali metal ions is effectively blocked; finally,
methane plasma treatment is carried out to introduce
methylsilane, a dynamic cross-linking structure is formed, scratch self-repair is realized, the surface
hardness after repair is improved, and the scratch resistance of the
wafer is improved.