Fabrication method of field-effect transistor and field-effect transistor

Abstract

The invention discloses a fabrication method of a field-effect transistor and the field-effect transistor. The method comprises the steps of forming an N-type MOSFET region on a substrate, wherein theN-type MOSFET region is partitioned by a shallow groove isolation region; forming a hard mask pattern on the N-type MOSFET region; forming a silicon nanowire array structure, wherein the silicon nanowire array substrate comprises silicon nanowires which are stacked in a multi-layer way; forming a sacrifice oxide layer on the multi-layer stacked silicon nanowires to control the size and the morphology of the nanowires and remove the oxide layer; and sequentially forming an interface oxide layer, a ferroelectric material dielectric lamination layer and a metal gate lamination layer at the nanowire array structure. In the field-effect transistor, the gate control capability is greatly improved by a nanowire annular gate structure, and a short channel effect is prevented; and due to the introduction of a ferroelectric negative capacitance effect, the surface potential of the channel can be amplified, so that the nanowire NMOSFET has super steep sub-threshold slope and improved on / off current ratio.

Description

technical field [0001] The disclosure belongs to the technical field of semiconductors, and relates to a manufacturing method of a field effect tube and the field effect tube. Background technique [0002] As the feature size of integrated circuits becomes smaller and smaller, planar CMOS devices have encountered serious challenges, and various new device structures have emerged. The gate structure of devices has evolved from traditional planar single gates to double gates, triple gates, and completely wrapped channel. The gate-all-around structure, the gate-control ability and the ability to control the short channel effect are continuously enhanced, and the MOSFET with the nanowire gate-all-around structure (GAA) with quasi-ballistic transmission characteristics is widely used due to its strong gate control ability and the ability to reduce the size. Attach great importance to it and become a strong competitor in the technology generation of 3nm and below. However, when t...

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Problems solved by technology

In the traditional field effect transistor, C S and C ins are all positive, resulting in (1+C S / C ins ) can never be less than 1, so it cannot be less than 60mV / dec. The negative capacitance effect of ferroelectric materials can make the ferroelectric capacitance negative, that is, C F <0

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