4 results about "Sub threshold" patented technology

The present application relates to a pixel circuit, a display panel and a display device, wherein the pixel circuit includes: a driving transistor, a threshold compensation transistor and a shielding layer; the threshold compensation transistor includes a first sub-threshold compensation transistor and a second sub-threshold compensation transistor; the active layer of the threshold compensation transistor includes a first sub-channel region, a second sub-channel region and a first connection region; the first sub-channel region and the second sub-channel region are electrically connected through the first connection region; in a direction perpendicular to the active layer, the first sub-channel region at least partially overlaps with the gate of the first sub-threshold compensation transistor, and the second sub-channel region at least partially overlaps with the gate of the second sub-threshold compensation transistor, and the overlapping area A of the first connection region and the shielding layer satisfies: the present application can maintain the stability of the gate potential of the driving transistor and solve the problem of low-frequency flickering of the display panel.

The present application relates to a pixel circuit, a display panel and a display apparatus. The pixel circuit comprises: a driving transistor, a threshold compensation transistor and a shielding layer, wherein the threshold compensation transistor comprises a first threshold compensation sub-transistor and a second threshold compensation sub-transistor; an active layer of the threshold compensation transistor comprises a first channel sub-region, a second channel sub-region and a first connection region; the first channel sub-region and the second channel sub-region are electrically connected to each other by means of the first connection region; and in a direction perpendicular to the active layer, the first channel sub-region at least partially overlaps a gate electrode of the first threshold compensation sub-transistor, the second channel sub-region at least partially overlaps a gate electrode of the second threshold compensation sub-transistor, and the overlapping area A of the first connection region and the shielding layer satisfies formula (I) and formula (II). In the present application, the stability of the potential of a gate electrode of a driving transistor can be maintained, thereby solving the problem of the low-frequency flicker of the display panel.

The invention discloses a method for improving the blade vibration sampling rate under a single sensor, and the method comprises the steps: firstly carrying out the abnormal burr removal of an original analog signal, and guaranteeing the signal stability; then, n rising edge events are recognized by setting an initial threshold value, and every n blades are divided into a processing unit group; fitting each group of data to obtain a smooth curve, and extracting the maximum value in the voltage minimum values and the minimum value in the maximum values to form a dynamic trigger interval; dividing a plurality of equidistant sub-thresholds in the interval, and executing upper and lower edge triggering on the signal under each sub-threshold to obtain a multi-resolution triggering sampling point; and finally, performing time alignment on the multi-threshold trigger points according to the blade number, and reconstructing a blade vibration displacement signal, thereby improving the calculation accuracy of the blade vibration displacement. The method is suitable for on-line deployment of an FPGA platform, remarkably improves the resolution capability of the tiny vibration response on the premise of not improving the hardware sampling rate, and has the advantages of simple structure, high robustness, high engineering realizability and the like.

A semiconductor device (410) includes an input terminal (411a), a threshold voltage generation circuit (411d), and at least one comparison circuit (411e). The threshold voltage generation circuit (411d) is configured to generate at least one threshold voltage (Vthx1 to VthxN) including a fluctuation component dependent on the power supply voltage (VCC1). A comparison circuit (411e) is configured to compare an input signal (AIN) with threshold voltages (Vthx1 to VthxN) to generate comparison signals (S1 to SN) based on a result of the comparison.