Fast electron measurement probe system suitable for magnetic confinement plasmas
A technology for measuring probes and plasma, which is applied in the field of plasma diagnosis, can solve problems such as damage to internal components of the device, and achieve stable mechanical properties, firm connections, and simple operation
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0035] Such as figure 1 As shown, a fast electron measuring probe system suitable for magnetically confined plasma, including boron nitride housing, fast electron probe assembly, Langmuir probe assembly and ceramic base. Wherein the boron nitride shell 1, the ceramic base 8, the fast electron probe assembly includes the graphite collector 5, the second copper terminal 6 and the second wire 7, and the Langmuir probe assembly includes the graphite pr...
PUM
![No PUM](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka.patsnap.com/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com