Resonant thermal infrared sensor and preparation method thereof
A thermal infrared, sensor technology, applied in the field of sensors, can solve problems such as low sensitivity, low quality factor, and lower resonance frequency
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Embodiment 1
[0068] For the resonant thermal infrared sensor structure whose drive and detection mode is electrostatic drive-capacitance detection, the resonant oscillator is manufactured using micromachining technology. The whole processing process includes:
[0069]1) Prepare a silicon-on-insulator CSOI (Cavity-Silicon-on Insulator, CSOI) substrate with a cavity, and the device layer of the CSOI is P-type heavily doped single crystal silicon;
[0070] 2) Pattern the device and the phononic crystal region by photolithography, and prepare a three-dimensional porous silicon structure in the phononic crystal region using an electrochemical corrosion process. The characteristic size of porous silicon is the characteristic size of the second phononic crystal structure;
[0071] 3) By thermal oxidation or low pressure chemical vapor deposition (Low pressure chemical vapor deposition, LPCVD) process to grow 0.2-1 μm thick silicon oxide on the CSOI substrate, or use LPCVD process to grow 0.2-1 μm...
Embodiment 2
[0074] For the resonant thermal infrared sensor structure whose drive and detection mode is piezoelectric drive-piezoelectric detection, the micromachining process is used to make it. The whole processing process includes:
[0075] 1) Prepare a silicon-on-insulator CSOI (Cavity-Silicon-on Insulator, CSOI) substrate with a cavity, and the device layer of the CSOI is P-type heavily doped single crystal silicon;
[0076] 2) Pattern the device and the phononic crystal region by photolithography, and prepare a three-dimensional porous silicon structure in the phononic crystal region using an electrochemical corrosion process. The characteristic size of porous silicon is the characteristic size of the second phononic crystal structure;
[0077] 3) Growing electrode / AlN / electrode piezoelectric stacks on the CSOI substrate device layer silicon by sputtering, and using patterned photolithography and etching techniques to etch to leave a patterned structure as a piezoelectric stack;
...
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