Manufacturing method of silicon carbide groove MOS (Metal Oxide Semiconductor) gate-controlled thyristor with three layers of epitaxy
A manufacturing method and technology of silicon carbide, applied in semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc., can solve problems such as high injection energy, avoid complex processes, improve channel mobility, and avoid lattice damage. Effect
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[0027] What the present invention aims to solve is that, in view of the harsh requirements on equipment and processes brought about by the MCT structure formed by traditional doping, the SIC MCT structure is realized by using SIC multilayer epitaxy as the wafer material and dry etching grooves;
[0028] like Figures 1 to 8 As shown, a manufacturing method of a silicon carbide grooved MOS gate-controlled thyristor with three-layer epitaxy of the present invention includes the following steps:
[0029] Step 1. Use a silicon carbide three-layer epitaxial wafer. The silicon carbide three-layer epitaxial wafer is an N+-type substrate 2, a P-type buffer zone 3, a P-type drift region 4, which are stacked from bottom to top. The N-type base region 5 and the P+ emitter region 6, the three-layer epitaxy of silicon carbide is the P-type drift region 4, the N-type base region 5 and the P+ emitter region 6; a mask is deposited on the wafer, and the corresponding light is used. The mask i...
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