Adhesive film and method for forming metal film using same

A technology for metal and adhesive films, which is applied in the fields of adhesives, thin film/sheet adhesives, semiconductor/solid device manufacturing, etc. It can solve the complex surface of metal non-film surface, damage or breakage of metal film, production Obstacles and other problems can be avoided, and the cleaning process can be saved, damage can be suppressed, and productivity can be improved.
CN1846295AActive Publication Date: 2006-10-11MITSUI CHEM TOHCELLO INC

Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
MITSUI CHEM TOHCELLO INC
Publication Date
2006-10-11
Patent Text Reader

Abstract

The present invention relates to an adhesive film capable of preventing damage to the metal non-film-forming surface of a semiconductor wafer during metal film formation and reducing contamination of the wafer surface. By using an adhesive film with an adhesive layer formed on one surface of a base film with at least one layer of film with a gas permeability of 5.0cc / m2·day·atm or less, the metal non-film-making surface can be protected, and the use of The solvent cleaning process can further reduce the contamination of the metal non-film-forming surface, and improve productivity and workability.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The present invention relates to an adhesive film for forming a metal film on a non-circuit-forming surface of a semiconductor wafer, and more particularly to an adhesive film capable of suppressing damage to the non-film-forming surface of the metal and contamination to the wafer during metal film forming, and an adhesive film using the adhesive film. The metal film method of bonding the film. According to the present invention, it is possible to omit the cleaning process of the metal non-film-forming surface, etc., to realize the rationalization of the process, and to improve the productivity. Background technique

[0002] As one of the high-temperature treatment steps in the semiconductor manufacturing process, there is a process of forming a metal film on the non-circuit-formed surface of the semiconductor wafer (hereinafter referred to as the back surface of the semiconductor wafer) after grinding.

[0003] Conventionally, a semiconductor wafer o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More