Method for preparing two-dimensional patterned nano-cuprous sulfide thin film
A copper sulfide, two-dimensional patterning technology, which is applied in the fields of final product manufacturing, sustainable manufacturing/processing, semiconductor/solid device manufacturing, etc. High reliability, low cost and good stability
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Embodiment 1
[0020] (1) Hydroxylation treatment on the surface of single crystal silicon substrate
[0021] Using single-crystal silicon wafer Si(100) as the substrate, carry out hydroxylation according to the following steps: first put acetone, ethanol, and secondary water into ultrasonic cleaning for 5 minutes, and rinse thoroughly with secondary water; put the cleaned silicon wafer into Piranha Solution (V(H 2 SO 4 ): V(H 2 o 2 )=7:3), and treated at 90°C for 2h, then rinsed with deionized water, dried with nitrogen, and set aside.
[0022] (2)-OH / -NH 2 - Construction of SAMs patterned surface
[0023] Prepare a 5mM 3-aminopropyltriethoxysilane (APS) solution with n-hexane as a solvent, immerse the treated and dried monocrystalline silicon wafer in this solution, assemble it at room temperature for 3 hours, and wash it with n-hexane, two Rinse with water and blow dry with nitrogen. Place a copper grid on the silicon wafer with APS SAMs on the surface and cover it with a quartz wa...
Embodiment 2
[0027] (1) Hydroxylation treatment on the surface of single crystal silicon substrate
[0028] Same method as above
[0029] (2)-OH / -NH 2 - Construction of SAMs patterned surface
[0030] Prepare a 5mM 3-aminopropyltriethoxysilane (APS) solution with n-hexane as a solvent, immerse the treated and dried monocrystalline silicon wafer in this solution, assemble it at room temperature for 6 hours, and wash it with n-hexane, two Rinse with water and blow dry with nitrogen. Place a copper grid on the silicon wafer with APS SAMs on the surface and cover it with a quartz wafer, and then irradiate it with ultraviolet light for 3 hours. During the irradiation process, the APS SAMs in the exposed area will change into hydroxyl groups, thus obtaining -OH / -NH 2 SAMs patterned silicon surface.
[0031] (3) Preparation of patterned cuprous sulfide film
[0032] Deposition condition is identical with embodiment 1
Embodiment 3
[0034] (1) Hydroxylation treatment on the surface of single crystal silicon substrate
[0035] Method is the same as embodiment 1
[0036] (2)-OH / -NH 2 - Construction of SAMs patterned surface
[0037] Method is the same as embodiment 1
[0038] (3) Preparation of patterned cuprous sulfide film
[0039] 0.125g CuSO 4 .5H 2 O, 0.279g EDTA was dissolved in 25mL of water to form a transparent and clear solution, and 1M H 2 SO 4 Adjust the pH to 3, then add 0.124 g of Na 2 S 2 o 3 , after mixing evenly, put the patterned SAMs substrate into the solution for deposition at 80°C twice, each time for 1h. After the substrate was taken out, it was rinsed with water twice, then ultrasonically cleaned for 10 min, dried with nitrogen, and finally the Cu 2 The S film was sintered at 300°C under the protection of nitrogen.
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