Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Semiconductor substrate and preparation method thereof

A semiconductor and substrate technology, applied in the field of semiconductor substrates and their preparation, can solve the problems of easy cracking, volatility and corrosion of GaN

Inactive Publication Date: 2011-01-26
SHANGHAI RES CENT OF ENG & TECH FOR SOLID STATE LIGHTING
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is to provide a preparation method capable of preparing a semiconductor substrate, through which the lithium aluminate substrate is improved to overcome the corrosion-prone, Li Volatility, and the problem of easy cracking of GaN due to the difference in thermal expansion coefficient between lithium aluminate and GaN

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor substrate and preparation method thereof
  • Semiconductor substrate and preparation method thereof
  • Semiconductor substrate and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach

[0026] An embodiment of preparing a semiconductor substrate of the present invention includes:

[0027] Provide lithium aluminate wafer;

[0028] A semiconductor substrate is obtained by depositing an AlN film layer on the lithium aluminate wafer by using a sputtering method.

[0029] According to the present invention, the lithium aluminate wafer is used as the base of the semiconductor substrate, and the lithium aluminate wafer needs to be polished. For the surface roughness of the lithium aluminate wafer, the root mean square roughness is preferably less than 10 angstroms, more preferably less than 8 angstroms , more preferably less than 5 angstroms. For the polishing method of the lithium aluminate wafer, the present invention is not particularly limited. According to the present invention, a (100) crystal plane lithium aluminate wafer is preferred as the base material of the semiconductor substrate.

[0030] According to the present invention, a sputtering method is us...

Embodiment 1

[0038] Place the polished lithium aluminate wafer with a surface root mean square roughness of 5 Angstroms (100) in the sputtering chamber of the measurement and control sputtering system, and vacuum the sputtering chamber to 2.0×10 -4 Pa; heat the lithium aluminate wafer to 400 °C and keep it warm, with flowing Ar and N 2 As sputtering gas, the flow rate of sputtering gas is about 15 sccm, Ar and N 2 The volume ratio is 3:1.

[0039] Using AlN ceramics with a purity of 99.99wt% as the target material, using radio frequency sputtering, the sputtering power is 200W, and the sputtering time is 20 minutes. After the sputtering, the lithium aluminate wafer deposited with AlN is cooled to Remove from room temperature. Carry out XRD test on the semiconductor substrate, the test results are as follows figure 1 As shown, the diffraction peaks located at 34.70°, 35.86°, and 73.19° in the figure correspond to the (200) crystal plane of lithium aluminate, the (0002) crystal plane of A...

Embodiment 2-4

[0041] In these three embodiments, the RF sputtering power in Embodiment 1 was adjusted to 300W, 400W, and 500W, and the sputtering time was 20 minutes, 30 minutes, and 40 minutes, respectively, and the others were the same as in Embodiment 1.

[0042] The three examples also produced (0001) aluminum nitride films with a high c-axis preferred orientation on the (100) plane lithium aluminate wafer.

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a preparation method of a semiconductor substrate, comprising the following steps: providing a lithium aluminate wafer, and depositing an AIN membrane layer on the lithium aluminate wafer by a sputtering method to obtain the semiconductor substrate. In the method, lithium aluminate crystal is taken as a substrate and then the AIN membrane layer is deposited on the substrateby the sputtering method to obtain the semiconductor substrate, wherein, due to small lattice mismatch between lithium aluminate and GaN, when the lithium aluminate crystal is taken as the GaN crystal growth substrate, a GaN epitaxial thin film can be prepared easily and high defect density caused by stress can be reduced. When the AIN membrane layer with the same crystal structure and similar lattice constant with the GaN is deposited on the lithium aluminate wafer, the problem that a GaN epitaxial wafer is easily cracked resulting from thermal expansion difference between the lithium aluminate crystal and the GaN is solved; in addition, AIN is taken as a buffer layer and can prevent volatilization of Li in the lithium aluminate substrate and protect the lithium aluminate substrate from corrosion of acidic or reducing atmosphere.

Description

technical field [0001] The invention relates to the field of semiconductors, in particular to a semiconductor substrate and a preparation method thereof. Background technique [0002] Group III-IV nitrides (InN, GaN, AlN) represented by GaN and their ternary and quaternary alloys have wide band gap, high electron drift saturation velocity, high thermal conductivity, high breakdown field strength, and high temperature resistance. It is an important direct band gap semiconductor material with excellent physical and chemical properties such as acid and alkali corrosion resistance, and has great application potential in blue light-emitting diodes, laser diodes, short-wavelength photodetection devices, and high-frequency high-power electronic devices. [0003] However, it is very difficult to grow GaN single crystals. At present, the growth of GaN thin films is mainly based on c-plane sapphire substrates, or using hydrogenated epitaxy (HVPE) to grow GaN self-supporting substrates...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/02H01L21/203C23C14/34C23C14/06
Inventor 杨卫桥王康平周颖圆马可军李抒智钱雯磊
Owner SHANGHAI RES CENT OF ENG & TECH FOR SOLID STATE LIGHTING
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products