Fe-Cr-Si ternary amorphous thin film capable of modulating band gap width and preparation method thereof
A fe-cr-si, amorphous thin film technology, applied in the field of Fe-Cr-Si ternary amorphous thin film and its preparation, can solve the problem of multiphase hybrid deterioration, prone to stacking fault, twinning, large film base loss. Matching and other problems, to achieve the effect that the process conditions are easy to control, the application prospect is broad, and the industrialization is convenient.
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Embodiment 1
[0031] Embodiment 1: Fe is prepared by magnetron sputtering method 3 Cr 1 Si 8 film
[0032] (1) Preparation of alloy sputtering target, the steps are as follows:
[0033] ①Material preparation: Weigh the value of each component according to the atomic percentage of Fe and Cr at 3:1, and the purity of Fe and Cr metal raw materials to be used is above 99.9%;
[0034] ② Fe 3 Cr 1 Melting of alloy ingots: Put the metal mixture in the water-cooled copper crucible of the melting furnace, and use the method of vacuum arc melting to melt under the protection of argon. First, vacuumize to 10 -2 Pa, then filled with argon until the pressure is 0.03±0.01MPa, the control range of melting current density is 150±10A / cm 2 After melting, continue to smelt for 10 seconds, turn off the power, let the alloy cool down to room temperature with the copper crucible, then turn it over, put it back in the water-cooled copper crucible, and carry out the second smelting; the aforementioned proces...
Embodiment 2
[0045] Embodiment 2: Fe is prepared by magnetron sputtering method 3 Cr 1 Si 13.6 film
[0046] The preparation process is the same as in Example 1, only the number of alloy sheets for preparing the combined alloy sputtering target is adjusted: by 5 sheets of Fe 3 Cr 1 The alloy sheet is pasted on the basic Si target used for sputtering. According to EPMA analysis, the contents of Fe, Cr, and Si in the film are 16.9 at.%, 5.7 at.%, and 77.4 at.%. The atomic ratio of Fe and Cr is 3:1, so the composition formula is written as Fe 3 Cr 1 Si 13.6 . The XRD and TEM results showed that the Fe 3 Cr 1 Si 13.6 No crystal information was found in the sample, indicating that the prepared amorphous film was prepared. TEM images measured the thickness of the film to be 315 nm, and the bandgap width was measured to be 0.54 eV.
Embodiment 3
[0047] Embodiment 3: Fe is prepared by magnetron sputtering method 3 Cr 1 Si 17.3 film
[0048] The preparation process is the same as in Example 1, only the number of alloy sheets for preparing the combined alloy sputtering target is adjusted: by 4 sheets of Fe 3 Cr 1 The alloy sheet is pasted on the basic Si target used for sputtering. According to EPMA analysis, the contents of Fe, Cr, and Si in the film are 14.1 at.%, 4.7 at.%, and 81.2 at.%. The atomic ratio of Fe and Cr is 3:1, so the composition formula is written as Fe 3 Cr 1 Si 17.3 . The XRD and TEM results showed that the Fe 3 Cr 1 Si 17.3 No crystal information was found in the sample, indicating that the prepared amorphous film was prepared. The TEM image measured the thickness of the film to be 323 nm, and the bandgap width was measured to be 0.60 eV.
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