Analysis method of trace impurity elements fe and cu in tin oxide electrode

A technology of trace impurity and analysis method, which is applied in the field of analysis of trace impurity elements in tin oxide electrodes, can solve the problems that tin oxide electrodes are not easy to dissolve, and achieve the effects of low loss, overcoming difficult dissolution, and accurate measurement

Active Publication Date: 2015-09-16
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Solve the problem that the tin oxide electrode is not easy to dissolve in acid or alkali by processing the sample of the tin oxide electrode and selecting the type, dosage and method of the reagent used for the molten sample

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Analysis method of trace impurity elements fe and cu in tin oxide electrode
  • Analysis method of trace impurity elements fe and cu in tin oxide electrode
  • Analysis method of trace impurity elements fe and cu in tin oxide electrode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] The analysis method of trace impurity elements Fe and Cu in the tin oxide electrode of the present invention comprises sample processing, experimental conditions, standard solution preparation, draws working curve, test, calculation, and the concrete steps of this method are:

[0033] 1. Sample treatment: Randomly take tin dioxide electrode samples, crush and grind them, pass the particle samples through a sieve to obtain particle samples no larger than 10 mesh, use an analytical balance to accurately weigh 0.3845g sample particles; weigh 1.2050gNaOH and 0.5032gKOH and mix; Put the ground tin oxide electrode powder in a platinum crucible and pre-fire it at 850°C for 30 minutes; take out the crucible, pour the mixture of NaOH and KOH into the crucible, put it in a muffle furnace at 900°C for 30 minutes; take it out and cool it to room temperature; Add warm water to the beaker for leaching, and take out the platinum crucible; add 15ml hydrochloric acid and 5ml nitric acid ...

Embodiment 2

[0050] The standard solution preparation of the present embodiment, drawing working curve, test and calculation are the same as Example 1, and the sample processing and experimental conditions are different, as follows:

[0051] 1. Sample treatment: Randomly take tin dioxide electrode samples, crush and grind them, pass the particle samples through a sieve to obtain particle samples no larger than 10 meshes, use an analytical balance to accurately weigh 0.5238g sample particles; weigh 1.8640gNaOH and 0.6730gKOH and mix; Put the ground tin oxide electrode powder in a platinum crucible and pre-fire it at 950°C for 20 minutes; take out the crucible, pour the mixture of NaOH and KOH into the crucible, put it in a muffle furnace at 950°C for 45 minutes; take it out and cool it to room temperature; Add warm water to the beaker for leaching, and take out the platinum crucible; add 21ml of hydrochloric acid and 7ml of nitric acid into the beaker, heat to dissolve and clarify; cool to r...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an analytical method of trace impurity elements Fe and Cu in a tin oxide electrode. The percentages of the trace impurity elements Fe and Cu in the tin oxide electrode are obtained through sample treatment, experiment conditions arranging, standard solution preparation, working curve line drawing, testing, and calculation by adopting an inductive coupling plasma atomic emission spectroscopy method. The analytical method of the trace impurity elements Fe and Cu in the tin oxide electrode, which is provided by the invention, has the characteristics of easiness in operation, high analytical speed and high measurement precision, and meets the requirement of accurately measuring the contents the trace impurity elements Fe and Cu in the tin oxide electrode.

Description

technical field [0001] The invention relates to a material analysis and test technology, in particular to an analysis method for trace impurity elements in tin oxide electrodes. Background technique [0002] Tin oxide electrode is a kind of ceramic semiconductor material, which has the characteristics of good high temperature resistance, low high temperature resistivity, good resistance to glass erosion and corrosion, so it is often used as electrode material for the melting of special optical glass. Trace impurity elements Fe and Cu in tin oxide electrodes will seriously affect the absorption loss index of special optical glass. Therefore, the content of trace impurity elements Fe and Cu in tin oxide electrodes must be strictly controlled. [0003] The content of impurity elements in high-purity tin oxide electrodes is very low, generally in the order of ppm, and it is difficult to use EDS, X-ray fluorescence and other methods for accurate analysis, so inductively coupled ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/73G01N1/28
Inventor 徐永春邹兆松胡丽丽
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products