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Gallium Nitride-based Enhanced Depletion-Mode Heterojunction Field-Effect Transistor with Buried Gate Structure

A heterojunction field effect, gallium nitride-based technology, applied in semiconductor devices, electrical components, circuits, etc., can solve the problems of difficult realization of P-type GaN materials, influence of material reliability, and high activation energy, so as to avoid disadvantages The effect of impact, high matching degree, and simple production process

Active Publication Date: 2017-05-10
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the P-type acceptor Mg activation energy of GaN materials is very high, and it is difficult to realize high-quality P-type GaN materials. At the same time, P-type doping will also affect the reliability of the material.

Method used

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  • Gallium Nitride-based Enhanced Depletion-Mode Heterojunction Field-Effect Transistor with Buried Gate Structure
  • Gallium Nitride-based Enhanced Depletion-Mode Heterojunction Field-Effect Transistor with Buried Gate Structure
  • Gallium Nitride-based Enhanced Depletion-Mode Heterojunction Field-Effect Transistor with Buried Gate Structure

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Embodiment

[0037] figure 1 It is a prior art GaNHFET structure, mainly including substrate 101, aluminum indium gallium nitride (Al x In y Ga z N) buffer layer 102, gallium nitride (GaN) channel layer 103, aluminum indium gallium nitride (Al x In y Ga z N) Barrier layer 104, gate dielectric layer 105, aluminum gallium nitride (Al x In y Ga z N) The source electrode 106 and the drain electrode 107 formed on the barrier layer 104, and the gate electrode 108 formed on the barrier dielectric layer 105, wherein the source electrode 106 and the drain electrode 107 are combined with aluminum indium gallium nitride (Al x In y Ga z N) The barrier layer 104 forms an ohmic contact, and the gate 108 forms a Schottky contact with the gate dielectric layer 105 .

[0038] figure 2 The structure schematic diagram of GaN-based enhanced depletion heterojunction field effect transistor with buried gate structure provided by the present invention mainly consists of substrate 101, AlInGaN buffer ...

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Abstract

The invention discloses a gallium nitride-based enhanced depletion heterojunction field effect transistor with a buried gate structure, which mainly consists of a substrate, an aluminum indium gallium nitrogen buffer layer, a buried gate, a buried gate dielectric layer, and a nitride Gallium channel layer, aluminum indium gallium nitride barrier layer, gate dielectric layer, source and drain on the aluminum indium gallium nitride barrier layer, gate on the gate dielectric layer, the source and drain are connected with aluminum The InGaN barrier layer forms an ohmic contact, the gate and the gate dielectric layer form a Schottky contact, the buried gate dielectric layer and the buried gate are both located in the AlInGaN buffer layer, and the buried gate is located in the buried in the gate dielectric layer. By biasing the buried gate separately, and according to different biases of the buried gate, the threshold voltage of the device can be adjusted; when the buried gate is at a negative bias, the buried gate depletes the two-dimensional electron gas of the gallium nitride channel layer, making the device Realize enhanced work; when the buried gate is at zero bias or positive bias, there is a two-dimensional electron gas in the gallium nitride channel layer, which makes the device realize depletion work.

Description

technical field [0001] The invention relates to the field of semiconductor devices, in particular to a gallium nitride-based enhanced depletion heterojunction field effect transistor with a buried gate structure. Background technique [0002] Gallium nitride (GaN)-based heterojunction field effect transistor has excellent characteristics such as large band gap, high critical breakdown electric field, high electron saturation velocity, good thermal conductivity, radiation resistance and good chemical stability. At the same time, GaN ( GaN) materials can form a two-dimensional electron gas heterojunction channel with high concentration and high mobility with materials such as aluminum gallium nitride (ALGaN), so it is especially suitable for high-voltage, high-power and high-temperature applications, and is the most potential for electronic applications one of the transistors. [0003] figure 1 It is a schematic diagram of the structure of a common GaN-based heterojunction f...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L29/78H01L29/10H01L29/423
CPCH01L29/42356H01L29/778
Inventor 杜江锋潘沛霖陈南庭于奇
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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