A kind of f-p pressure sensor and forming method based on mems process
A pressure sensor and process technology, which is applied in the process of producing decorative surface effects, metal material coating process, and photoengraving process of pattern surface, etc. It can avoid the problems of poor detection accuracy and low detection sensitivity, and achieve the effect of avoiding the reduction of detection accuracy and resolution, and taking into account the measurement accuracy and high resolution.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0055] A schematic diagram of the structure of a MEMS-based F-P pressure sensor is shown in figure 1 As shown, the F-P pressure sensor mainly includes a F-P pressure-sensitive MEMS chip 1, a collimated beam expanding optical fiber 2 and a base 3;
[0056] Wherein, the structure diagram of F-P pressure-sensitive MEMS chip 1 is as follows figure 2 As shown, the F-P pressure-sensitive MEMS chip 1 is composed of SOI silicon wafer and glass wafer 4;
[0057] Described SOI silicon chip comprises top layer silicon 5, middle oxide layer 6 and bottom layer silicon 7; Wherein, the upper surface of bottom layer silicon 7 is deposited with anti-reflection film I8 and passivation layer 10; The thickness direction of the silicon wafer is processed with an annular groove deep to the bottom silicon 7, and a cylindrical boss is formed in the center of the annular groove; the surface of the cylindrical boss is at the same interface as the bottom silicon 7 and the intermediate oxide layer 6. ...
PUM
Property | Measurement | Unit |
---|---|---|
depth | aaaaa | aaaaa |
thickness | aaaaa | aaaaa |
reflectance | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com