Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Cooling and annealing process of solar cell

A solar cell and annealing process technology, applied in circuits, photovoltaic power generation, electrical components, etc., can solve problems such as affecting the conversion efficiency of cells, reducing carrier life, and short-wave deterioration of cells, reducing lattice damage, Improve the lifetime of minority carriers and improve the effect of ohmic contact

Inactive Publication Date: 2016-06-29
江苏彩虹永能新能源有限公司
View PDF4 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, diffusion is the core step. The conventional diffusion junction process uses nitrogen to carry phosphorus oxychloride, and at the same time, large nitrogen and dry oxygen are introduced to react with silicon wafers at high temperatures. In this way, the phosphorus concentration on the surface of the silicon wafer after diffusion is too high, which is prone to thermal defects, and the life of the minority carriers will be reduced due to the high phosphorus concentration on the surface, and the diffusion "dead layer" is thicker, resulting in a corresponding deterioration of the short wave of the battery sheet. Affect the conversion efficiency of the cell

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0019] (1). Diffusion source in low temperature state: constant temperature at 750°C, and large nitrogen and dry oxygen are introduced throughout the process, wherein the flow rate of small nitrogen: 900sccm, the maximum flow rate of nitrogen: 15slm, and the flow rate of dry oxygen: 300sccm, duration: 1200s;

[0020] (2). Diffusion push junction in high temperature state: Raise the temperature of the furnace tube to 820°C with a certain temperature rise slope and keep it constant, and feed large nitrogen and dry oxygen. The maximum nitrogen flow rate is 15slm, and the dry oxygen flow rate is 300sccm. The duration is: 900s;

[0021] (3). Cooling down the silicon wafers out of the furnace and stabilizing the temperature of the furnace tube: Take the silicon wafers out of the furnace tube with a silicon carbide paddle and cool them on the silicon carbide paddle. ℃, duration 300s, feed nitrogen 10slm;

[0022] (4). Low-temperature annealing in the second furnace: silicon wafers ...

Embodiment 2

[0026] (1). Diffusion source in low temperature state: constant temperature at 770°C, and large nitrogen and dry oxygen are introduced throughout the process, wherein the flow rate of small nitrogen: 850sccm, the maximum flow rate of nitrogen: 15slm, and the flow rate of dry oxygen: 300sccm, duration: 1500s;

[0027] (2). Diffusion push junction in high temperature state: Raise the temperature of the furnace tube to 820°C through a certain temperature rise slope and keep it constant, and feed large nitrogen and dry oxygen. The maximum nitrogen flow rate is: 17slm, and the dry oxygen flow rate is: 400sccm. The duration is: 1200s;

[0028] (3). The temperature of the silicon wafer is lowered out of the furnace, and the temperature of the furnace tube is stabilized: the silicon wafer is taken out of the furnace tube with a silicon carbide paddle, cooled on the silicon carbide paddle, and at the same time, the temperature of the furnace tube is lowered by using the steps of enteri...

Embodiment 3

[0033] (1). Diffusion source in low temperature state: constant temperature at 770°C, and large nitrogen and dry oxygen are introduced throughout the process, wherein the flow rate of small nitrogen: 850sccm, the flow rate of large nitrogen: 17slm, and the flow rate of dry oxygen: 400sccm, duration: 1200s;

[0034] (2). Diffusion push junction in high temperature state: Raise the temperature of the furnace tube to 820°C through a certain temperature rise slope and keep it constant, and feed large nitrogen and dry oxygen. The maximum nitrogen flow rate is: 17slm, and the dry oxygen flow rate is: 400sccm. The duration is: 1200s;

[0035] (3). The temperature of the silicon wafer is lowered out of the furnace, and the temperature of the furnace tube is stabilized: the silicon wafer is taken out of the furnace tube with a silicon carbide paddle, cooled on the silicon carbide paddle, and at the same time, the temperature of the furnace tube is lowered by using the steps of entering...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a cooling and annealing process of a solar cell. The cooling and annealing process comprises the following steps of (1) diffusing to enter a boat; (2) oxidizing; (3) diffusing and introducing a source in a low-temperature state; (4) diffusing and pushing a junction in a high-temperature state; (5) taking out a silicon wafer out of a furnace, cooling the silicon wafer, and stabilizing the temperature of a furnace tube; (6) throwing the silicon wafer into the furnace for second times, and carrying out low-temperature annealing; and (7) diffusing to get out of the boat. By the cooling and annealing process, a diffusion dead layer is reduced, thermal defect caused by high-temperature reaction is reduced, and thus, the conversion efficiency of the solar cell is improved; particularly, the open-circuit voltage is obviously increased and is higher than that of a traditional process by 2mV, a filling factor is also improved, and thus, the conversion efficiency of the battery cell is obviously improved; and the thickness of a PN-junction dead layer of the silicon wafer surface after diffusion is reduced, lattice damage brought by high-temperature diffusion is reduced, and minority carrier lifetime is prolonged.

Description

technical field [0001] The invention relates to a temperature-lowering annealing process for solar cells. Background technique [0002] At present, the process of polycrystalline silicon solar cells has become increasingly mature and standardized production has been achieved. The main process steps are as follows: acid corrosion texturing→diffusion junction→wet etching trimming→PECVD anti-reflection coatingscreen printingsintering→testing and sorting . Among them, diffusion is the core step. The conventional diffusion junction process uses nitrogen to carry phosphorus oxychloride, and at the same time, large nitrogen and dry oxygen are introduced to react with silicon wafers at high temperatures. In this way, the phosphorus concentration on the surface of the silicon wafer after diffusion is too high, which is prone to thermal defects, and the life of the minority carriers will be reduced due to the high phosphorus concentration on the surface, and the diffusion "dead lay...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L31/18H01L21/228
CPCH01L21/228H01L31/1804H01L31/1864Y02E10/547Y02P70/50
Inventor 袁磊殷武徐为孙翔王孟孟常宇峰
Owner 江苏彩虹永能新能源有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products