Cooling and annealing process of solar cell
A solar cell and annealing process technology, applied in circuits, photovoltaic power generation, electrical components, etc., can solve problems such as affecting the conversion efficiency of cells, reducing carrier life, and short-wave deterioration of cells, reducing lattice damage, Improve the lifetime of minority carriers and improve the effect of ohmic contact
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Embodiment 1
[0019] (1). Diffusion source in low temperature state: constant temperature at 750°C, and large nitrogen and dry oxygen are introduced throughout the process, wherein the flow rate of small nitrogen: 900sccm, the maximum flow rate of nitrogen: 15slm, and the flow rate of dry oxygen: 300sccm, duration: 1200s;
[0020] (2). Diffusion push junction in high temperature state: Raise the temperature of the furnace tube to 820°C with a certain temperature rise slope and keep it constant, and feed large nitrogen and dry oxygen. The maximum nitrogen flow rate is 15slm, and the dry oxygen flow rate is 300sccm. The duration is: 900s;
[0021] (3). Cooling down the silicon wafers out of the furnace and stabilizing the temperature of the furnace tube: Take the silicon wafers out of the furnace tube with a silicon carbide paddle and cool them on the silicon carbide paddle. ℃, duration 300s, feed nitrogen 10slm;
[0022] (4). Low-temperature annealing in the second furnace: silicon wafers ...
Embodiment 2
[0026] (1). Diffusion source in low temperature state: constant temperature at 770°C, and large nitrogen and dry oxygen are introduced throughout the process, wherein the flow rate of small nitrogen: 850sccm, the maximum flow rate of nitrogen: 15slm, and the flow rate of dry oxygen: 300sccm, duration: 1500s;
[0027] (2). Diffusion push junction in high temperature state: Raise the temperature of the furnace tube to 820°C through a certain temperature rise slope and keep it constant, and feed large nitrogen and dry oxygen. The maximum nitrogen flow rate is: 17slm, and the dry oxygen flow rate is: 400sccm. The duration is: 1200s;
[0028] (3). The temperature of the silicon wafer is lowered out of the furnace, and the temperature of the furnace tube is stabilized: the silicon wafer is taken out of the furnace tube with a silicon carbide paddle, cooled on the silicon carbide paddle, and at the same time, the temperature of the furnace tube is lowered by using the steps of enteri...
Embodiment 3
[0033] (1). Diffusion source in low temperature state: constant temperature at 770°C, and large nitrogen and dry oxygen are introduced throughout the process, wherein the flow rate of small nitrogen: 850sccm, the flow rate of large nitrogen: 17slm, and the flow rate of dry oxygen: 400sccm, duration: 1200s;
[0034] (2). Diffusion push junction in high temperature state: Raise the temperature of the furnace tube to 820°C through a certain temperature rise slope and keep it constant, and feed large nitrogen and dry oxygen. The maximum nitrogen flow rate is: 17slm, and the dry oxygen flow rate is: 400sccm. The duration is: 1200s;
[0035] (3). The temperature of the silicon wafer is lowered out of the furnace, and the temperature of the furnace tube is stabilized: the silicon wafer is taken out of the furnace tube with a silicon carbide paddle, cooled on the silicon carbide paddle, and at the same time, the temperature of the furnace tube is lowered by using the steps of entering...
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