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Copper alloy sputtering target and method for manufacturing same

A manufacturing method and sputtering target technology, applied in sputtering coating, semiconductor/solid-state device manufacturing, metal material coating process, etc., can solve the problem of low resistivity, reduce impurities, and suppress the generation of powder particles Effect

Active Publication Date: 2017-08-29
JX NIPPON MINING & METALS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These inventions can prevent the occurrence of defects such as voids, protrusions, and disconnections, have low resistivity, and can have EM resistance and oxidation resistance. Dust particles caused by impurities are increasingly regarded as problems

Method used

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  • Copper alloy sputtering target and method for manufacturing same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038]Cu with a purity of 6N or higher was prepared, introduced into a water-cooled copper crucible, and melted by irradiating plasma under an argon atmosphere introduced with 4% by volume of hydrogen by a plasma arc melting method. Then, this molten metal was introduced into a water-cooled copper crucible, Al with a purity of 4N or higher was added so as to be 1 atomic %, and smelted by a plasma arc melting method. Next, molten metal of the copper alloy is poured into a water-cooled copper mold, melted by vacuum induction melting, and a solidified ingot is pulled out from the bottom of the mold.

[0039] Next, the ingot was formed into a diameter of 180 mm×thickness of 160 mm, hot forged at 700° C., and then rolled to a diameter of 460 mm×thickness of 24.5 mm by cold rolling. Then, heat treatment was performed at 400° C., and then quenched to produce a rolled sheet. This rolled plate was machined to manufacture a sputtering target with a diameter of 440 mm and a thickness of...

Embodiment 2

[0043] Cu with a purity of 6N or higher was prepared, introduced into a water-cooled copper crucible, and melted by irradiating plasma under an argon atmosphere by a plasma arc melting method. Then, 4% by volume of hydrogen gas was added to the atmosphere during melting, and melting was performed again. Then, this molten metal was introduced into a water-cooled copper crucible in the next stage, Al with a purity of 4N or higher was added so as to be 1 atomic %, and melting was performed by a plasma arc melting method. Next, the molten metal is poured into a water-cooled copper mold, melted by vacuum induction melting, and the solidified ingot is pulled from the bottom of the mold.

[0044] Next, this alloy ingot was processed into a sputtering target by the same method and conditions as in Example 1, and then this sputtering target was bonded to a backing plate by diffusion bonding. As a result of examining the impurity concentration of a part of the cut ingot, the total cont...

Embodiment 3

[0046] Cu with a purity of 6N or higher was prepared, introduced into a water-cooled copper crucible, and melted by an electron beam melting method in a vacuum atmosphere in which hydrogen gas was added at a flow rate of 400 ml / min or higher. Then, this molten metal is introduced into the water-cooled copper crucible of the next stage, and high-purity Al having a purity of 4N or higher is added so as to be 1 atomic %, and melted by an electron beam melting method. Next, the molten metal is poured into a water-cooled copper mold, melted by vacuum induction melting, and the solidified ingot is pulled from the bottom of the mold.

[0047] Next, this alloy ingot was processed into a sputtering target by the same method and conditions as in Example 1, and then this sputtering target was bonded to a backing plate by diffusion bonding. The impurity concentration of a part of the cut ingot was examined. As a result, the total content of metal impurities was 1 wtppm or less, and the ca...

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Abstract

Provided is a copper alloy sputtering target, characterized in that the oxygen content, as determined by charged particle activation analysis, is 0.6 wt ppm or less, or the oxygen content is 2 wt ppm or less, and the carbon content is 0.6 wt ppm or less. Also provided is a method for manufacturing a copper alloy sputtering target, characterized in that a copper starting material is melted in a vacuum or inert gas atmosphere, a reducing gas then added to the atmosphere during melting, and then alloy elements are added to the molten metal to alloy the metal, and the ingot obtained thereby is worked to a target shape. The present invention addresses the problem of providing a copper alloy sputtering target that produces few particles during sputtering, and a method for manufacturing the same.

Description

technical field [0001] The present invention relates to a copper alloy sputtering target and a manufacturing method thereof, particularly a sputtering target suitable for forming a thin film containing a copper alloy used as wiring in a semiconductor integrated circuit, and a manufacturing method thereof. Background technique [0002] Conventionally, Al (resistivity: about 3.1 μΩ·cm) has been used as a wiring material for semiconductor integrated circuits, but Cu (resistivity: about 1.7 μΩ·cm) with lower resistance has been put into practical use as wiring becomes smaller. As a copper wiring formation process, in many cases, a diffusion barrier layer such as Ta or TaN is formed on a wiring layer or a wiring groove, and then copper is electroplated. In order to perform this electroplating, copper or a copper alloy is generally deposited as a base layer (seed layer) by sputtering. [0003] However, for fine wiring with a wiring width of 0.130nm or less, such as 90nm, 65nm, 45...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): C23C14/34C22C9/00C22F1/08H01L21/285C22C9/01C22C9/05C22F1/00
CPCB22D7/005C22C1/02C22C9/00C22C9/01C22C9/05C22F1/00C22F1/08C23C14/34H01J37/3426H01L21/285C23C14/3414C23C14/165H01L21/2855H01L21/28568H01L21/76873
Inventor 守井泰士大月富男
Owner JX NIPPON MINING & METALS CORP