Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Improved low-silver Sn-Ag-Au solder for microelectronic packaging and preparation method thereof

A technology of microelectronic packaging and solder, which is applied in welding equipment, welding/cutting media/materials, welding media, etc., can solve the problem of decreased service reliability of solder joints, reduced creep performance of alloys, thermal fatigue performance, and poor welding quality To achieve the effect of improving the mechanical properties and creep properties at room temperature, improving the tensile strength and creep resistance properties, and improving the mechanical properties at room temperature

Inactive Publication Date: 2019-08-09
SOUTH CHINA UNIV OF TECH
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] (1) The solder alloy composition deviates from the eutectic point, the melting point increases, the melting range increases, the fluidity and wettability of the molten pool during the welding process decrease, and the risk of oxidation increases, resulting in poor welding quality and reduced solderability ;
[0006] (2) The reduction of Ag content makes the strengthening phase in the matrix: Ag 3 The amount of Sn phase is greatly reduced, and the strengthening effect is reduced
The normal temperature mechanical properties of the alloy are reduced;
[0007] (3) The content of the soft primary β-Sn phase increases, which reduces the creep performance and thermal fatigue performance of the alloy, and greatly reduces the service reliability of the solder joint;
[0008] (4) The higher Sn content makes the interface intermetallic compound (IMC) layer grow rapidly during service, especially the interface Cu 3 The Sn layer grows rapidly, the thickness of the interface IMC layer increases, and the service reliability of the solder joint decreases.
However, compared with high-silver solder, low-silver solder has lower strength and hardness, higher melting point, poor wettability, and poor thermal fatigue, which cannot fully meet the needs of modern microelectronics industry production.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Improved low-silver Sn-Ag-Au solder for microelectronic packaging and preparation method thereof
  • Improved low-silver Sn-Ag-Au solder for microelectronic packaging and preparation method thereof
  • Improved low-silver Sn-Ag-Au solder for microelectronic packaging and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0050] The preparation method of following embodiment and comparative example is as follows:

[0051] 1) Weigh the raw material according to the weight percentage, place it in an electromagnetic induction heating furnace, heat it up to 1000°C for melting in an inert gas argon protective atmosphere, and keep it warm for 0.5h;

[0052] 2) cooling to 600°C and remelting 3 times to ensure that the composition of the obtained alloy is uniform, and then air cooling to obtain a solder ingot for later use;

[0053] 3) Alloy ingots can be used directly as solder, or made into plates, strips, foils, filaments by rolling, extrusion and other mechanical processing methods, or atomized into 20-38μm ultra-fine solder powder by close-coupled gas atomization equipment , mix the flux ready for use.

[0054] The solder compositions of different embodiments and comparative examples are shown in Table 1.

[0055] Table 1 Low silver Sn-Ag-Cu lead-free solder

[0056] Numbering Ag / wt% ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses improved low-silver Sn-Ag-Au solder for microelectronic packaging and a preparation method thereof. The solder comprises the following components of, by mass of 0.3%-1.0% of Ag, 0.5%-1.0% of Cu, 0.05%-0.5% of Nb and 97.5%-99.07% of Sn. The solder alloy has the advantage that the Nb element is added in trace on the premise of maintaining the good anti-drop performance of thelower-silver Sn-Ag-Cu solder alloy, so that dislocation movement is hindered, the normal temperature mechanical property of the solder is improved, and the creep resistance is greatly improved; an Zrelement is added, so that the synergistic effect of the Zr element and the Nb element can be achieved, further dispersed distribution of the Nb is promoted, meanwhile, the alloy structure is refined,and the strength and the hardness of the solder are improved; and the liquidity of liquid solder can be improved by addition of a rare earth element Yb, the wettability can be improved, and the creepresistance of brazing filler metal can be improved.

Description

technical field [0001] The invention relates to solder, in particular to a low-silver Sn-Ag-Cu solder for improving microelectronic packaging and a preparation method thereof. Background technique [0002] Surface mount technology (SMT) has experienced nearly half a century of development since its inception. It has not only become the mainstream of contemporary circuit assembly technology, but also is developing in depth, promoting electronic products to miniaturization, light weight, high precision and high reliability. The direction of development has increased the number of I / O pins in the circuit, the number of solder joints has increased, the size has become smaller, and the spacing has become narrower and narrower. The sharp reduction in the size of solder joints poses a challenge to the performance and reliability of electronic solder. Studies have shown that 70% of the failures of electronic devices are caused by the failures of packaging and assembly, among which ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): B23K35/26B23K35/14
CPCB23K35/0222B23K35/262B23K2101/36
Inventor 王泓瑄覃业霞
Owner SOUTH CHINA UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products