Surface plasmon enhanced LED optical communication device and manufacturing method thereof
A surface plasmon, optical communication technology, applied in the field of visible light communication, can solve the problems of low modulation bandwidth, low efficiency of LED light source, shortage, etc., and achieve the effect of enhancing modulation bandwidth, improving light source efficiency, and low cost
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Embodiment 1
[0052] The preparation method of the surface plasmon enhanced LED optical communication device comprises the steps of:
[0053] (1) Select a green light InGaN epitaxial wafer, the thickness of the N-type GaN layer 1 is 2um, the electron blocking layer 200nm, and the thickness of the P-type GaN layer 3 is 500nm; x Ga 1-x The period number of the N / GaN quantum well active layer 2 is 10, the In composition is 0.3, and the emission wavelength is 510nm. The thickness of the InGaN well layer is 3nm, and the thickness of the GaN barrier layer is 12nm.
[0054] (2) Using PECVD technology to grow a dielectric layer SiO on the surface of the substrate 2 , with a thickness of 100nm.
[0055] (3) Evaporating a Ni metal film with a thickness of 30 nm by using electron beam evaporation technology.
[0056] (4) Perform high-temperature heat treatment on the above-mentioned metal vapor-deposited substrate, and perform annealing in a high-temperature and high-purity nitrogen environment to ...
Embodiment 2
[0067] The preparation method of the surface plasmon enhanced LED optical communication device comprises the steps of:
[0068] (1) Select a green light InGaN epitaxial wafer, the thickness of the N-type GaN layer 1 is 2um, the electron blocking layer 200nm, and the thickness of the P-type GaN layer 3 is 500nm; x Ga 1-x The period number of the N / GaN quantum well active layer 2 is 10, the In composition is 0.3, and the emission wavelength is 510nm. The thickness of the InGaN well layer is 3nm, and the thickness of the GaN barrier layer is 12nm.
[0069] (2) Using PECVD technology to grow a dielectric layer SiO on the surface of the substrate 2 , with a thickness of 100nm.
[0070] (3) Evaporating a Ni metal film with a thickness of 30 nm by using electron beam evaporation technology.
[0071] (4) Perform high-temperature heat treatment on the above-mentioned metal vapor-deposited substrate, and perform annealing in a high-temperature and high-purity nitrogen environment to ...
Embodiment 3
[0081] The preparation method of the surface plasmon enhanced LED optical communication device comprises the steps of:
[0082] (1) Select a green light InGaN epitaxial wafer, the thickness of the N-type GaN layer 1 is 2um, the electron blocking layer 200nm, and the thickness of the P-type GaN layer 3 is 500nm; x Ga 1-x The period number of the N / GaN quantum well active layer 2 is 10, the In composition is 0.3, and the emission wavelength is 510nm. The thickness of the InGaN well layer is 3nm, and the thickness of the GaN barrier layer is 12nm.
[0083] (2) Using PECVD technology to grow a dielectric layer SiO on the surface of the substrate 2 , with a thickness of 100nm.
[0084] (3) Evaporating a Ni metal film with a thickness of 30 nm by using electron beam evaporation technology.
[0085] (4) Perform high-temperature heat treatment on the above-mentioned metal vapor-deposited substrate, and perform annealing in a high-temperature and high-purity nitrogen environment to ...
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