Preparation method of TOPCon structure battery

A battery and polysilicon technology, used in circuits, electrical components, final product manufacturing, etc., can solve problems such as large fluctuations in efficiency and yield, decline in product yield, and narrow process window, to improve diffusion capacity, ensure stability, The effect of a wide process window

Active Publication Date: 2019-11-05
CHANGZHOU SHICHUANG ENERGY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 1. Use hydrofluoric acid and nitric acid to remove the polysilicon on the front side of the silicon wafer. The process window of this method is narrow, which can easily lead to damage to the front PN junction, which will greatly reduce the product yield.
[0006] 2. Only inorganic alkali (potassium hydroxide or sodium hydroxide) is used to remove the polysilicon coated on the front side of the silicon wafer. This method has certain requirements on the thickn

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] A kind of preparation method of TOPCon structure battery, its concrete steps comprise:

[0033] 1) Texturing;

[0034] 2) Boron diffusion;

[0035] 3) Acid etching: single-sided acid cleaning and etching on the back of the silicon wafer, retaining the BSG on the front side of the silicon wafer;

[0036] 4) LPCVD coating of oxide layer and polysilicon, and complete the expansion of phosphorus;

[0037] 5) Remove the positive PSG;

[0038] 6) Remove the polysilicon on the front side of the silicon wafer through the alkaline solution mixed with additives;

[0039] The mass percentage of each component of the additive is: 2% to 5% glyceryl monostearate, 1% to 2.5% diethylene glycol, 1% to 2.5% sodium laurate, 1% ~2% β-cyclodextrin, the balance is deionized water;

[0040] The alkaline solution is a KOH solution; the mass percentage of KOH in the KOH solution is 1% to 3%;

[0041] The mass ratio of the additive to the alkali solution is 0.5 to 3:100;

[0042] The sili...

Embodiment 2

[0048] On the basis of embodiment 1, the difference is:

[0049] In step 6), the alkaline solution is NaOH solution; the mass percentage of NaOH in the NaOH solution is 1%-3%.

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PUM

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Abstract

The invention discloses a preparation method of a TOPCon structure battery, and the method comprises the following steps: before a step of removing polycrystalline silicon winding plating, reserving aBSG on the front surface of a silicon wafer; in the step of removing the polycrystalline silicon winding plating, removing the polycrystalline silicon on the front surface of the silicon wafer by adding an alkaline solution of an additive, wherein the additive comprises the following components in percentage by mass: 2%-5% of glyceryl monostearate, 1%-2.5% of diethylene glycol, 1%-2.5% of sodiumlaurate and 1%-2% of beta-cyclodextrin and the balance of deionized water, and the alkaline solution is a KOH solution or a NaOH solution. According to the method, the polycrystalline silicon windingplating is removed by adding the alkaline solution of the additive, so that the BSG can be protected from being corroded by the alkaline solution, and furthermore, alkali cannot corrode a phosphorus diffusion part and a boron diffusion part. The process window is wider, the efficiency is more stable, the diffusion capacity can be improved, a groove type machine and a chain type machine can be applied, and a production line can conveniently use an existing machine table to achieve mass production.

Description

technical field [0001] The invention relates to a preparation method of a TOPCon structure battery. Background technique [0002] TOPCon (Tunnel Oxide Passivated Contact) structure cell is a high-efficiency crystalline silicon solar cell technology. This technology prepares an ultra-thin tunnel oxide layer and a highly doped polysilicon thin layer on the back of the cell. passivated contact structure. [0003] In the preparation process of the TOPCon structure battery, a layer of polysilicon (polysilicon) needs to be plated on the back of the silicon wafer, but this step will cause wrap-around plating, which will cause the front edge of the silicon wafer to be coated with polysilicon, which will affect the appearance and efficiency, and lead to the failure of the finished product. downgrade. [0004] For the removal of polysilicon plating, there are three main solutions in the industry: [0005] 1. Use hydrofluoric acid and nitric acid to remove the polysilicon on the fro...

Claims

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Application Information

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IPC IPC(8): H01L31/18H01L31/0216
CPCH01L31/02167H01L31/1804H01L31/186H01L31/1868Y02P70/50
Inventor 张益荣邓雨微罗飞马洁王思云
Owner CHANGZHOU SHICHUANG ENERGY CO LTD
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