Nano precipitate image acquisition method based on scanning electron microscope back scattering mode

Abstract

The invention provides a nano precipitate image acquisition method based on a scanning electron microscope back scattering mode. The nano precipitate image acquisition method comprises the following steps of sample pretreatment, electrolytic double-spray thinning, low-temperature erosion and scanning electron microscope shooting, so as to obtain a nano precipitate morphology image. According to the nano precipitate image acquisition method, the thickness of the sample is reduced, the purposes of improving the conductivity of the sample and reducing the magnetic influence are achieved, so thatthe imaging quality of the nano precipitate image in the steel material under the scanning electron microscope is improved; and compared with a traditional sample preparation and shooting method, a clearer image with a higher multiple can be obtained by adopting the nano precipitate image acquisition method, and the nano precipitate image acquisition method has certain significance in precipitatemorphology observation and size and distribution statistics.

Description

【Technical field】 [0001] The invention relates to the technical field of iron and steel metallurgy, in particular to a method for acquiring images of nano-precipitates based on scanning electron microscope backscattering mode. 【Background technique】 [0002] The phase in the material that is distributed in the matrix phase in a discontinuous state and in which it is impossible to surround other phases is called the precipitated phase. When the fine and dispersed precipitates are evenly distributed in the matrix phase, it will have a significant strengthening effect, and the number, size and distribution of the precipitates will affect its mechanical properties. Therefore, the statistical analysis of the precipitates in metal materials It has certain research significance. [0003] Metallographic analysis, as one of the important means of experimental research on metal materials, plays a pivotal role in the field of metal materials research. The tools for analyzing the micr...

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Problems solved by technology

[0005] In view of this, the present invention provides a nano-precipitate image acquisition method based on the scanning electron microscope backscattering mode, which overcomes the difficulty of observing the nanoscale structure of the metallographic sample under the high magnification of the scanning electron microscope. Thickness method to achieve the purpose of improving the conductivity and reducing the influence of the magnetic field, and provide a new sample preparation method, coupled with the corresponding scanning electron microscope parameters, so as to improve the observation quality of nano-scale organization under the scanning electron microscope

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