A Nitride Resonant Tunneling Diode Structure Suitable for Ultraviolet Light Detection
A resonant tunneling and nitride technology, which is applied in the direction of semiconductor devices, electrical components, circuits, etc., can solve the problems that affect the resonant tunneling of electrons to the double barrier structure, the lifting range is large, and the resonant tunneling cannot occur.
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[0030] According to the above-mentioned material structural features, a specific embodiment of the present invention is as follows: image 3 shown.
[0031] Using GaN self-supporting substrate material, from the substrate material to the top, it includes:
[0032] (1) GaN self-supporting substrate material.
[0033] (2) n-type doped GaN electrode layer 1, thickness 100 nm, electron concentration = 5E18 cm -3 .
[0034] (3) Intrinsic GaN layer 2 with a thickness of 20 nm.
[0035] (4) AlGaN / GaN superlattice layer 3, the superlattice has a periodic structure of Al0.5Ga0.5N=2 nm, GaN=1 nm, and the number of superlattice periods=13 periods.
[0036] (5) Resonant tunneling double barrier structure layer 4, wherein AlN barrier layer 4-1, thickness 2 nm; GaN quantum well layer 4-2, thickness 3 nm; AlN barrier layer 4-3, thickness 2 nm.
[0037] (6) GaN doped layer 5, thickness 10 nm, p-type doping, hole concentration = 1E17 cm -3 .
[0038] (7) GaN light absorption layer 6, th...
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