Unlock instant, AI-driven research and patent intelligence for your innovation.

A Method for Optimizing Grain Size and Uniformity of Tantalum Sheets

A technology of grain size and uniformity, which is applied in the field of optimizing the grain size and uniformity of tantalum plates, can solve the problems of inability to guarantee the fineness and uniformity of grain size in the thickness direction, low total processing rate of medium-thick plate rolling, It is difficult to obtain fine and uniform grains, so as to avoid insufficient grain crushing, reduce structure differences, and improve structure uniformity.

Active Publication Date: 2022-05-27
西安诺博尔稀贵金属材料股份有限公司
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the prior art, the fineness and uniformity of the grain size in the thickness direction cannot be guaranteed when preparing plates with a thickness greater than 5mm, so that the finished plate not only has a grain size of more than 50 μm, but also has a grain size difference greater than 2 in the thickness direction. , can not meet the rapid development of integrated circuits and the needs of heavy blows
[0004] There are three reasons for the above phenomenon of medium and thick plates: one is that the raw material tantalum ingot grains are coarse and uneven, especially the original grains of the tantalum ingot melted by electron beam are abnormally coarse, and the edge of the ingot is slightly smaller The equiaxed crystals of tantalum have a size of about 10-50 mm, and the center is an abnormally thick columnar crystal, with a maximum size of 100 mm. Second, due to the poor forgeability of tantalum, even after repeated upsetting forging, the plastic deformation is distributed from the surface to the core. It is always uneven; the third is that the total processing rate of medium-thick plate rolling is small, and it is difficult to obtain plates with fine and uniform grains

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Method for Optimizing Grain Size and Uniformity of Tantalum Sheets
  • A Method for Optimizing Grain Size and Uniformity of Tantalum Sheets
  • A Method for Optimizing Grain Size and Uniformity of Tantalum Sheets

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] like figure 1 As shown, a method for optimizing the grain size and uniformity of a tantalum sheet in this embodiment includes the following steps:

[0043] Step 1. Under the room temperature environment, the electron beam smelting tantalum ingot with a circular cross-sectional shape and a circular diameter of 220 mm is flattened by a fast forging machine with a forging ratio of 1.0 to obtain a size of 137×274×L 1 The cross-sectional shape of mm is a rectangular tantalum billet; the length of the rectangle is 274mm and the width is 137mm; the tantalum ingot is a tantalum ingot that has been smelted by electron beams at least twice, and the aspect ratio of the tantalum ingot is ≥1.2 ; Forging ratio of 1.0 means that the cross-sectional area is unchanged before and after forging, that is, the cross-sectional area of ​​the tantalum billet with a rectangular cross-sectional shape is equal to the cross-sectional area of ​​the tantalum ingot with a circular cross-sectional sha...

Embodiment 2

[0053] like figure 1 As shown, a method for optimizing the grain size and uniformity of a tantalum sheet in this embodiment includes the following steps:

[0054] Step 1. Under the room temperature environment, the electron beam smelting tantalum ingot with a circular cross-sectional shape and a circular diameter of 240 mm is flattened by a fast forging machine with a forging ratio of 1.0 to obtain a size of 150×300×L 1 The cross-sectional shape of mm is a rectangular tantalum billet; the length of the rectangle is 300mm and the width is 150mm; the tantalum ingot is a tantalum ingot that has been smelted by electron beams at least twice, and the aspect ratio of the tantalum ingot is ≥1.2 ; Forging ratio of 1.0 means that the cross-sectional area is unchanged before and after forging, that is, the cross-sectional area of ​​the tantalum billet with a rectangular cross-sectional shape is equal to the cross-sectional area of ​​the tantalum ingot with a circular cross-sectional sha...

Embodiment 3

[0064] like figure 1 As shown, a method for optimizing the grain size and uniformity of a tantalum sheet in this embodiment includes the following steps:

[0065] Step 1. Under the room temperature environment, the electron beam smelting tantalum ingot with a circular cross-sectional shape and a circular diameter of 280mm is flattened by a fast forging machine with a forging ratio of 1.0 to obtain a size of 175×350×L 1 The cross-sectional shape of mm is a rectangular tantalum billet; the length of the rectangle is 350mm and the width is 175mm; the tantalum ingot is a tantalum ingot that has been smelted by electron beams at least twice, and the aspect ratio of the tantalum ingot is ≥1.2 ; Forging ratio of 1.0 means that the cross-sectional area is unchanged before and after forging, that is, the cross-sectional area of ​​the tantalum billet with a rectangular cross-sectional shape is equal to the cross-sectional area of ​​the tantalum ingot with a circular cross-sectional shap...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
sizeaaaaaaaaaa
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a method for optimizing the grain size and uniformity of a tantalum plate, comprising: step 1, flattening a tantalum ingot with a circular cross-section at room temperature with a fast forging machine to obtain a rectangular cross-section Tantalum billet; Step 2, sawing, to obtain a tantalum billet with a square cross-section; Step 3, forging a round shape after heat preservation, to obtain a round billet; Step 4, the first annealing treatment, to obtain an annealed rod Billet; Step 5, extruding after heat preservation to obtain a slab with a rectangular cross-sectional shape; Step 6, annealing for the second time to obtain a slab after annealing; Step 7, rolling to obtain a plate; Step 8, annealing for the third time processing to obtain finished tantalum plates. The method of the present invention can realize the preparation of medium-thick tantalum plates of 5 mm to 20 mm, the grain size is better than 6.5 grades, the maximum grain size is ≤ 38 μm, the grain size in the thickness direction of the plate is uniform, and the grain size difference between the surface layer and the core is within 100 μm. Within 0.5 level.

Description

technical field [0001] The invention belongs to the technical field of material processing, and particularly relates to a method for optimizing the grain size and uniformity of a tantalum plate. Background technique [0002] Metal tantalum has high melting point, low vapor pressure, low evaporation rate at high temperature, low ductile-brittle transition temperature (DBTT) and special dielectric properties, and can be widely used in the preparation of integrated circuit sputtering targets; in addition, tantalum also has high density , a certain tensile strength and good ductility characteristics, compared with copper has a higher penetration, is also one of the ideal materials for the drug-type cover. Since the size and uniformity of the crystal grains directly affect the performance of the sputtered film and the performance of the drug mask, as the grain size is smaller, the deposition rate of the sputtered film is higher and the uniformity is better. The armor-piercing po...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): C22F1/18
CPCC22F1/18
Inventor 郝小雷刘倚天宜楠武宇张锟宇权振兴王飞陈昊
Owner 西安诺博尔稀贵金属材料股份有限公司